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2016
Emission-active thin carbon films grown at monocrystalline silicon substrates were studied by the methods of scanning tunneling microscopy and tunneling spectroscopy. Spatial non-uniformity of photoirradiation effect onto electric properties has been detected.
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Emission-active thin carbon films grown at monocrystalline silicon substrates were studied by the methods of scanning tunneling microscopy and tunneling spectroscopy. Spatial non-uniformity of photoirradiation effect onto electric properties has been detected.
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