Results 11 to 20 of about 220,510 (260)

Template-Derived Masks for 4D-STEM

Communications Materials
Fast pixelated detectors in scanning transmission electron microscopy (STEM) enable acquisition of a two-dimensional diffraction pattern at every probe position, known as four-dimensional STEM (4D-STEM).
Yining Xie, Eoin Moynihan, Marin Alexe, Louis F. J. Piper, Ana M. Sanchez, Richard Beanland   +5 more
doaj   +2 more sources

4D-STEM Ptychography for Electron-Beam-Sensitive Materials. [PDF]

ACS Cent Sci, 2022
Recent advances in high-speed pixelated electron detectors have substantially facilitated the implementation of four-dimensional scanning transmission electron microscopy (4D-STEM). A critical application of 4D-STEM is electron ptychography, which reveals the atomic structure of a specimen by reconstructing its transmission function from redundant ...
Li G, Zhang H, Han Y.
europepmc   +4 more sources

Biomaterials for 4D stem cell culture. [PDF]

Curr Opin Solid State Mater Sci, 2016
Stem cells reside in complex three-dimensional (3D) environments within the body that change with time, promoting various cellular functions and processes such as migration and differentiation. These complex changes in the surrounding environment dictate cell fate yet, until recently, have been challenging to mimic within cell culture systems. Hydrogel-
Hilderbrand AM, Ovadia EM, Rehmann MS, Kharkar PM, Guo C, Kloxin AM.   +5 more
europepmc   +4 more sources

Denoising 4D STEM datasets with PCA [PDF]

BIO Web of Conferences
Potapov Leonid, Wu Mingjian
doaj   +2 more sources

Orientation mapping of graphene using 4D STEM-in-SEM. [PDF]

Ultramicroscopy, 2020
A scanning diffraction technique is implemented in the scanning electron microscope. The technique, referred to as 4D STEM-in-SEM (four-dimensional scanning transmission electron microscopy in the scanning electron microscope), collects a diffraction pattern from each point on a sample which is saved to disk for further analysis.
Caplins BW, Holm JD, White RM, Keller RR.   +3 more
europepmc   +4 more sources

4D-STEM of Beam-Sensitive Materials [PDF]

Accounts of Chemical Research, 2021
ConspectusScanning electron nanobeam diffraction, or 4D-STEM (four-dimensional scanning transmission electron microscopy), is a flexible and powerful approach to elucidate structure from "soft" materials that are challenging to image in the transmission electron microscope because their structure is easily damaged by the electron beam.
Karen C. Bustillo, Steven E. Zeltmann, Min Chen, Jennifer Donohue, Jim Ciston, Colin Ophus, Andrew M. Minor   +6 more
openaire   +4 more sources

Optimizing contrast in automated 4D-STEM cryo-tomography

Microscopy and Microanalysis
Abstract 4D STEM is an emerging approach to electron microscopy. While it was developed principally for high-resolution studies in materials science, the possibility to collect the entire transmitted flux makes it attractive for cryomicroscopy in application to life science and radiation-sensitive materials where dose efficiency is of
Seifer S, Kirchweger P, Edel KM, Elbaum M.   +3 more
europepmc   +3 more sources

Patterned probes for high precision 4D-STEM bragg measurements [PDF]

Ultramicroscopy, 2020
Nanoscale strain mapping by four-dimensional scanning transmission electron microscopy (4D-STEM) relies on determining the precise locations of Bragg-scattered electrons in a sequence of diffraction patterns, a task which is complicated by dynamical scattering, inelastic scattering, and shot noise. These features hinder accurate automated computational
Zeltmann, Steven E, Müller, Alexander, Bustillo, Karen C, Savitzky, Benjamin, Hughes, Lauren, Minor, Andrew M, Ophus, Colin   +6 more
openaire   +5 more sources

AutoDisk: Automated diffraction processing and strain mapping in 4D-STEM

Ultramicroscopy, 2022
Development in lattice strain mapping using four-dimensional scanning transmission electron microscopy (4D-STEM) method now offers improved precision and feasibility. However, automatic and accurate diffraction analysis is still challenging due to noise and the complexity of intensity in diffraction patterns.
Sihan Wang, Tim B. Eldred, Jacob G. Smith, Wenpei Gao   +3 more
openaire   +3 more sources

Shadow montage and cone-beam reconstruction in 4D-STEM tomography

Microscopy and Microanalysis
Abstract Diffraction images in a scanning transmission electron microscope (STEM) provide a real-space projection of the sample at sufficient probe defocus. Such shadow images may be acquired patch by patch in a 4D-STEM setup using a pixelated detector and assembled into a shadow montage.
Seifer S, Houben L, Elbaum M.
europepmc   +3 more sources