Results 281 to 290 of about 2,568,206 (333)

Operando Heating and Cooling Electrochemical 4D-STEM Probing Nanoscale Dynamics at Solid-Liquid Interfaces.

Journal of the American Chemical Society
Operando/in situ methods have revolutionized our fundamental understanding of molecular and structural changes at solid-liquid interfaces and enabled the vision of "watching chemistry in action". Operando transmission electron microscopy (TEM) emerges as
Sungin Kim, V. Briega-Martos, Shikai Liu, Kwanghwi Je, Chuqiao Shi, K. Stephens, S. Zeltmann, Zhijing Zhang, Rafael Guzman-Soriano, Wenqi Li, Jiahong Jiang, Juhyung Choi, Yafet J Negash, Franklin S Walden, N. L. Marthe, Patrick S Wellborn, Yaofeng Guo, John Damiano, Yimo Han, E. Thiede, Yao Yang   +20 more
semanticscholar   +1 more source

Differentiating electron diffuse scattering via 4D-STEM spatial fluctuation and correlation analysis in complex FCC alloys.

Ultramicroscopy
Complex face-centered-cubic (FCC) alloys frequently display chemical short-range ordering (CSRO), which can be detected through the analysis of diffuse scattering.
Po-Cheng Kung, Rui Feng, Peter K. Liaw, J. Zuo, Jessica Krogstad   +4 more
semanticscholar   +1 more source

Removing constraints of 4D-STEM with a framework for event-driven acquisition and processing.

Ultramicroscopy
Pixelated detectors in scanning transmission electron microscopy (STEM) generate large volumes of data, often tens to hundreds of GB per scan. However, to make current advancements scalable and enable widespread adoption, it is essential to use the most ...
Arno Annys, H. Robert, S. Gholam, J. Hadermann, J. Verbeeck   +4 more
semanticscholar   +1 more source

In Situ 4D‐STEM Imaging of the Orientation of Lamellar Clusters in Polymer Crystallization

Macromolecular rapid communications
In semi‐crystalline polymeric materials, the initial stages of nucleation and the growth path of crystalline domains can determine the final performance.
Min Chen, Karen C. Bustillo, Yen-Jea Lee, C. Ophus, J. Ciston, Brooks A. Abel, Xi Jiang, N. Balsara, A. M. Minor   +8 more
semanticscholar   +1 more source

Comparative electron diffraction analysis of strain relaxation in AlxGa1-xN materials in the microelectronics industry: 4D-STEM approach vs. TEM-based N-PED solution.

Micron
Owing to its high spatial resolution and its high sensitivity to chemical element detection, transmission electron microscopy (TEM) technique enables to address high-level materials characterization of advanced technologies in the microelectronics field.
Estève Drouillas, Jean-Gabriel Mattei, Bénédicte Warot-Fonrose   +2 more
semanticscholar   +1 more source

Tiny Bubbles: Combined HR(S)TEM and 4D-STEM Analysis of Sub-Nanometer He Bubbles in Au.

Microscopy and Microanalysis
Irradiation produces a distribution of defect sizes in materials, with the smallest defects often below one nanometer in size and approaching the scale of a single unit cell in metals. While high-resolution scanning transmission electron microscopy (STEM)
Sean H. Mills, C. Gammer, Alex Y W Lin, A. Kohnert, C. Chisholm, K. Hattar, Peter Ercius, Peter Hosemann, A. M. Minor   +8 more
semanticscholar   +1 more source

4D-STEM-in-SEM: Changing an SEM Microscope to a User-friendly Powder Electron Diffractometer.

Microscopy and Microanalysis
We describe recent improvements of our method named powder nanobeam diffraction in four-dimensional scanning transmission electron microscopy (4D-STEM/PNBD). The method can change an arbitrary SEM equipped with a 2D-array STEM detector to a user-friendly
M. Šlouf, P. Sikorová, Ewa Pavlova, M. Świętek, L. Lartigue, R. Skoupý, Vladislav Krzyzanek   +6 more
semanticscholar   +1 more source

Unsupervised Multi-Clustering and Decision-Making Strategies for 4D-STEM Orientation Mapping

Digital Discovery
This study presents a novel integration of unsupervised learning and decision-making strategies for the advanced analysis of 4D-STEM datasets, with a focus on non-negative matrix factorization (NMF) as the primary clustering method.
Junhao Cao, Nicolas Folastre, Gozde Oney, E. Rauch, S. Nicolopoulos, P. P. Das, Arnaud Demortière   +6 more
semanticscholar   +1 more source

Multi-angle Precession Electron Diffraction (MAPED): A Versatile Approach to 4D-STEM Precession.

Microscopy and Microanalysis
Precession of a converged beam during acquisition of a 4D-STEM dataset improves strain, orientation, and phase mapping accuracy by averaging over continuous angles of illumination.
S. Ribet, R. Dhall, C. Ophus, Karen C. Bustillo   +3 more
semanticscholar   +1 more source

Using Aberrations to Improve Dose-Efficient Tilt-corrected 4D-STEM Imaging.

Microscopy and Microanalysis
Tilt-corrected imaging methods in four-dimensional scanning transmission electron microscopy (4D-STEM) have recently emerged as a new class of direct ptychography methods that are especially useful at low dose.
Desheng Ma, David A. Muller, S. Zeltmann
semanticscholar   +1 more source