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AC product defect level and yield loss
IEEE Transactions on Semiconductor Manufacturing, 1990The author considers the AC defect level and yield loss after test for both logic and random-access-memory semiconductor chips. Computation of chip AC defect level and yield loss after test is dependent upon the availability of statistical information regarding the behavior of the chip's delay and of the tester error.
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AC Loss in High-Tc Superconductors
2000There are three kinds of AC losses in superconducting wires, transport current losses, magnetization losses and total losses. The first losses are caused by the AC transport currents flowing in the wires, the second caused by the AC external magnetic fields which the wires are subject to and the third caused by the combination of the transport currents
Osami Tsukamoto +2 more
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AC losses in superconducting niobium
1973This thesis is concerned with measurements of alternating field losses in cylindrical rods of niobium in its superconducting state. Six samples have been investigated each with a different surface condition, Magnetization measurements of the samples have been studied which show the effect of the surface condition on the first critical magnetic field H ...
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Mitigation of chromosome loss in clinical CRISPR-Cas9-engineered T cells
Cell, 2023Jennifer Doudna
exaly
Dielectric Loss Mechanism in Electromagnetic Wave Absorbing Materials
Advanced Science, 2022Limin Zhang, Wu Hongjing, Ming Qin
exaly
Loss odyssey in medical image segmentation
Medical Image Analysis, 2021Rui Huang, Matthew Ng, Yu Li
exaly
Diabetes mellitus and hearing loss: A review
Ageing Research Reviews, 2021Dorit Samocha-Bonet, David Ryugo
exaly
AC Losses in High-Tc Materials
1998Most anticipated applications of the high-temperature superconductors require that the material be subjected to time-varying or alternating applied currents and magnetic fields. To be economically competitive, the superconductor generally must have ac losses well below those in conventional materials such as copper.
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Suppressing the Loss of Polymer‐Based Dielectrics for High Power Energy Storage
Advanced Materials, 2023Zhi-Min Dang +2 more
exaly

