Results 211 to 220 of about 221,595 (265)

Agitation system accelerated life testing

2015 Annual Reliability and Maintainability Symposium (RAMS), 2015
Accelerated Life Testing (ALT) is an effective method of demonstrating and improving product reliability in applications where the product is expected to perform for a long period of time. ALT accelerates a given failure mode by testing at higher stress level(s) in excess of operational limits.
Kummar Belanke, Mukund Bagal, Sidharth Singh   +2 more
openaire   +1 more source

Accelerated Life Testing and Experts' Opinion in Reliability.

Journal of the Royal Statistical Society. Series A (Statistics in Society), 1990
Introduction. Accelerated life testing and experts' opinion in reliability (D.V. Lindley). Experts' Opinions. Modern aspects of probability and utility (M.H. De Groot). The use of probability statements (D.V. Lindley). Choosing among experts (M.H. De Groot). A Bayesian view of weighted distributions and selection models (M.J. Bayarri and M.H. De Groot).
Francisco J. Samaniego, C. A. Clarotti, D. V. Lindley   +2 more
openaire   +1 more source

PLANNING FOR ACCELERATED LIFE TESTS

International Journal of Reliability, Quality and Safety Engineering, 1999
We present two alternative perspectives to the current way of planning for constant-stress accelerated life tests (CSALTs) and step-stress ALT (SSALT). In 3-stress CSALT, we consider test plans that not only optimize the stress levels but also optimize the sample allocation.
openaire   +1 more source

Bayesian estimation in accelerated life testing

International Journal of Product Development, 2009
A common problem of high-reliability computing is, on the one hand, the magnitude of total testing time required, particularly in the case of high-reliability components; and, on the other hand, the number of devices under testing. In both cases, the objective is to minimise the costs involved in testing without reducing the quality of the data ...
Sorin Voiculescu, Fabrice Guerin, Mihaela Barreau, Abderafi Charki   +3 more
openaire   +1 more source

Challenges in accelerated life testing

The Ninth Intersociety Conference on Thermal and Thermomechanical Phenomena In Electronic Systems (IEEE Cat. No.04CH37543), 2004
Accelerated testing typically targets-life estimation and defect or design weakness identification. The intent is to obtain more information from a given test time than would normally be possible. Time compression is typically achieved by acceleration of single or combination of stresses- temperature, vibration, humidity, etc. Short product development
openaire   +1 more source

Bayesian design for life tests and accelerated life tests

2018
This paper describes Bayesian methods for life test planning with Type II censored data from a Weibull distribution, when the Weibull shape parameter is given. We use conjugate prior distributions and criteria based on estimating a quantile of interest of the lifetime distribution. One criterion is based on a precision factor for a credibility interval
openaire   +2 more sources

Accelerated Life Testing of Capacitors

IRE Transactions on Reliability and Quality Control, 1957
One of the problems facing the designer of modern electronic communication systems is the ultimate reliability to be achieved under service conditions. The required level of reliability together with the unavoidable complexity of present-day equipment calls for components having extremely low failure rates.
openaire   +1 more source

Accelerated Life Testing Method of Transmission

Key Engineering Materials, 2006
In this study, we proposed a process of an accelerated life testing method of 5-speed manual transmissions used in vehicles, which loads are consisted of multiple alternating loads. The entire process of an 5-speed manual transmission’s accelerated life testing method where no failures are allowed, is a process that requires an abundance of assumptions,
Hyoung Eui Kim, Doh Sik Kim, Yoon Pyo Lee, Yung Chul Yoo   +3 more
openaire   +1 more source

Minimax approach to accelerated life tests

IEEE Transactions on Reliability, 1998
This article explores how the minimax approach to designing experiments applies to the Weibull and lognormal regression models used in accelerated life testing (ALT). When tackling these problems, the local optimal approach assumes the parameters in the information matrix known, while in the Bayes approach, prior distributions are imposed on them.
J. Ginebra, A. Sen
openaire   +1 more source

Optimum step‐stress for temperature accelerated life testing

Quality and Reliability Engineering International, 2007
AbstractStep‐stress accelerated life testing is a design strategy where the stress is modified several times during the test. In this work we address the problem of designing such a test. We focus on temperature accelerated life testing and we address the problems of setting the step duration and the stress levels.
openaire   +3 more sources