Results 101 to 110 of about 2,028,364 (331)
Single pilot IFR accident data analysis [PDF]
The aircraft accident data recorded and maintained by the National Transportation Safety Board for 1964 to 1979 were analyzed to determine what problems exist in the general aviation single pilot instrument flight rules environment.
Harris, D. F., Morrisete, J. A.
core +1 more source
This work introduces a vacuum‐free liquid metal printing approach to create ultrathin zinc–tin composite oxide nanosheets. The material shows strong UV light responsiveness and high sensitivity to ammonia gas at room temperature, highlighting the potential of mixed metal oxides for advanced environmental sensors and optoelectronic device technologies ...
Vaishnavi Krishnamurthi+15 more
wiley +1 more source
Simulation of rod ejection accident byPARCS code [PDF]
This paper describes reactor core model used for simulating REA. The model was designed in PARCS utilizing graphical interface SNAP. The data for model were given from benchmark NEACPR L-335.
Matějková, J.
core
Open Challenges and Opportunities in Piezoelectricity for Tissue Regeneration
This review provides an intriguing review of the recent advancements, challenges, and future perspectives regarding the application of piezoelectric scaffolds in tissue regeneration. The detailed exposition is anticipated to propel the advancement of personalized and intelligent piezoelectric implants, thereby fostering significant progress in this ...
Xiaoling Deng+7 more
wiley +1 more source
Electrical Accidents from the Clinical and Forensic Standpoint [PDF]
S Jellinek
openalex +1 more source
Electric scooters accidents: Analyses of two Swedish accident data sets.
H. Stigson, I. Malakuti, M. Klingegård
semanticscholar +1 more source
Cerebrovascular Accidents in Hospitals for Acute Cases [PDF]
Phil Brown
openalex +1 more source
Critical Assessment of Contact Resistance and Mobility in Tin Perovskite Field‐Effect Transistors
Contact resistance and field‐effect transistor (FET) mobility of Cs0.15FA0.85SnI3 tin perovskites are determined using gated four‐point‐probe (4PP) FET measurements in a Hall bar geometry. The results indicate that contact resistance can significantly impact transistor characteristics, often leading to underestimation or overestimation of FET mobility ...
Youcheng Zhang+9 more
wiley +1 more source