Results 321 to 330 of about 918,921 (421)

AMMONIA TEST FOR MEAT SPOILAGE

open access: hybrid, 1919
Kirsten Falk, Grace McGuire
openalex   +1 more source

TFT Backplanes Doped by BF2 Ion for Improved Stability and AMOLED Display Quality

open access: yesAdvanced Electronic Materials, EarlyView.
BF₂ ion in LTPS TFT induces an additional shallow defect level near the valence band edge, which is confirmed by deep‐level transient spectroscopy test. BF₂ in the poly Si functions as a donor, facilitating mutual compensation of defect charges within the TFT channel, and consequently, BF₂‐doped TFT channels exhibit a lower density of deep‐level traps,
Ying Shen   +8 more
wiley   +1 more source

Dopant Diffusion‐Induced Dielectric Breakdown: Stacked Dielectric Reliability on Heavily Doped Polysilicon

open access: yesAdvanced Electronic Materials, EarlyView.
This study reveals a novel failure mode in SiO₂/Si₃N₄ stacked capacitors, where dopant diffusion leads to interfacial oxide thinning, reducing dielectric breakdown voltage. Experimental results show that n type capacitors exhibit superior reliability, whereas p type capacitors fail rapidly.
Shuo Wang   +7 more
wiley   +1 more source

High Linearity and Symmetry Ferroelectric Artificial Neuromorphic Devices Based on Ultrathin Indium‐Tin‐Oxide Channels

open access: yesAdvanced Electronic Materials, EarlyView.
Ultrathin ITO and ferroelectric HZO are used to fabricate synaptic transistors. The device has a great on/off ratio ≈108 with a memory window of 1.73 V, successfully simulates the characteristics of the human brain, and achieves good linearity of 0.45 for potential and 0.73 for depression and low asymmetry of 0.89.
Siwei Wang   +8 more
wiley   +1 more source

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