Results 121 to 130 of about 52,583 (159)

A Novel 1-bit Fast and Low Power 17-T Full Adder Circuit

2024 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS)
This proposed study shows a novel 1-bit fast and low-power 17-T XOR-XNOR Full adder circuit, a significant step forward in the field of digital circuit design. The XOR-XNOR circuit, which has been recognized as a vital component, has a significant impact
Kripi Gupta, Ravindra Tiwari, Nikita Singh, Aachman Agrawal, Abhay Pratap Singh, R. Baghel   +5 more
semanticscholar   +1 more source

A fully digital power system simulator operating in real time

Proceedings of 1996 Canadian Conference on Electrical and Computer Engineering, 1996
R. Kuffel, J. Giesbrecht, T. Maguire, R. Wierckx, P. McLaren   +4 more
semanticscholar   +1 more source

Design and Implementation of a Novel Circuit-Based Memristive Non-autonomous Hyperchaotic System with Conservative and Offset Boosting for Applications to Image Encryption

Circuits, systems, and signal processing, 2023
Pratyusha Nune, Santanu Mandal
semanticscholar   +1 more source

An improved design of high-signal-to-noise ratio spiral-coil EMAT for high-temperature defect detection

Nondestructive Testing and Evaluation
The study introduces an enhanced concentric spiral-coil EMAT to tackle low signal-to-noise ratio (SNR) in high-temperature carbon steel forging defect detection.
Yuxuan Zou, Wenze Shi, Chao Lu, Bo Hu, Fasheng Qiu, Yuan Liu   +5 more
semanticscholar   +1 more source

A short channel MOSFET modelling for analogue circuit design with emphasis on carrier mobility

International Symposium on Signals, Circuits and Systems, 2009
A. Sevcenco, G. Brezeanu, M. Badila
semanticscholar   +1 more source

Robust parameter identification for virtual test of systems on a chip

, 2000
H. Kadim, D. Harvey
semanticscholar   +1 more source

Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing

Journal of electronic testing, 2007
A. Bounceur, S. Mir, E. Simeu, L. Rolíndez   +3 more
semanticscholar   +1 more source

Multiple Stuck-at Fault Testability Analysis of ROBDD Based Combinational Circuit Design

Journal of electronic testing, 2018
Toral Shah, A. Matrosova, M. Fujita, Virendra Singh   +3 more
semanticscholar   +1 more source

Test pattern generator optimization for digital testing of analogue circuits

International Conference on the Internet, Cyber Security and Information Systems, 2017
Aiman M. Mousa, M. El-Mahlawy
semanticscholar   +1 more source

Fringing Field Capacitive Sensor for Measuring Soil Water Content: Design, Manufacture, and Testing

IEEE Transactions on Instrumentation and Measurement, 2015
Jaime Mizuguchi, J. Piai, J. D. França, M. B. D. M. França, Karina Yamashita, L. Mathias   +5 more
semanticscholar   +1 more source