Results 201 to 210 of about 737,146 (331)
Erratum: ‘Fast algorithm based on superpixel‐level conditional triplet Markov field for successive‐approximation resistor image segmentation’ [PDF]
openalex +1 more source
This paper proposes two projector‐based Hopfield neural network (HNN) estimators for online, constrained parameter estimation under time‐varying data, additive disturbances, and slowly drifting physical parameters. The first is a constraint‐aware HNN that enforces linear equalities and inequalities (via slack neurons) and continuously tracks the ...
Miguel Pedro Silva
wiley +1 more source
Monte Carlo approximation of the logarithm of the determinant of large matrices with applications for linear mixed models in quantitative genetics. [PDF]
Bermann M +5 more
europepmc +1 more source
Current Tracking Adaptive Control of Brushless DC Motors
In this paper, the current tracking for Brushless Direct Current motors is approached considering uncertainty in the parameters of the motor's model. An adaptive control scheme to compensate electrical parameters uncertainty is proposed without requiring any knowledge of the mechanical parameters.
Fernanda Ramos‐García +3 more
wiley +1 more source
Benchmarking Diffusion Annealing-Based Bayesian Inverse Problem Solvers. [PDF]
Crafts ES, Villa U.
europepmc +1 more source
Global Virtual Time Approximation with Distributed Termination Detection Algorithms
Friedemann Mattern, A.A. Schoone, G. Tel
openalex +1 more source
Outer approximation algorithm for nondifferentiable optimization problems [PDF]
D.Q. Mayne, E. Polak
openalex +1 more source
A Guaranteed Approximation Algorithm for Scheduling Fork-Joins with Communication Delay
Pierre-François Dutot +3 more
openalex +1 more source
Predicting extreme defects in additive manufacturing remains a key challenge limiting its structural reliability. This study proposes a statistical framework that integrates Extreme Value Theory with advanced process indicators to explore defect–process relationships and improve the estimation of critical defect sizes. The approach provides a basis for
Muhammad Muteeb Butt +8 more
wiley +1 more source

