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An In‐Line Machine Vision–Based Profilometry Tool for Non‐Destructive Thickness Assessment of Perovskite Films

Advanced Electronic Materials, EarlyView.
This work proposes a machine‐vision‐based tool for predicting the thickness of in‐line deposited perovskite films, enabling real‐time decision making to control deposition parameters. The workflow integrates perovskite deposition and annealing with uniformity analysis and minimodule fabrication.
Juan Pablo Velásquez +9 more
wiley +1 more source

Advancing Energy Materials by In Situ Atomic Scale Methods

Advanced Energy Materials, Volume 15, Issue 11, March 18, 2025.
Progress in in situ atomic scale methods leads to an improved understanding of new and advanced energy materials, where a local understanding of complex, inhomogeneous systems or interfaces down to the atomic scale and quantum level is required. Topics from photovoltaics, dissipation losses, phase transitions, and chemical energy conversion are ...
Christian Jooss +21 more
wiley +1 more source

Human vs. LLM Creativity: A Comparative Analysis of Task-Dependent Asymmetry and Linguistic Mechanisms. [PDF]

J Intell
Yang L, Xin T, Yu Y, Wu Y.
europepmc +1 more source

Fifty Years of Killing and Letting Die: On the Limits of Philosophical Bioethics. [PDF]

Bioethics
Räsänen J, Häyry M.
europepmc +1 more source

Echoes in AI: Quantifying lack of plot diversity in LLM outputs. [PDF]