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Testing and Diagnosing Comparison Faults of TCAMs with Asymmetric Cells

IEEE Transactions on Computers, 2012
Ternary content addressable memory (TCAM) is a key component in various digital systems due to its fast lookup operation. Symmetric and asymmetric TCAM cells are two widely used cells for implementing a TCAM array. This paper presents several comparison fault models of TCAMs with asymmetric cells based on electrical defects.
openaire   +2 more sources

Masking asymmetric line faults using semi-distance codes

[1988] The Eighteenth International Symposium on Fault-Tolerant Computing. Digest of Papers, 2003
The authors propose a masking method for asymmetric line faults in LSIs using semidistance codes, which are a class of nonlinear codes. Faults caused by open or short circuit defects in line areas of LSIs can be made asymmetric by controlling the bus driver and the bus terminal gates. The conditions required for codes to mask these faults are clarified,
Kazumitsu MATSUZAWA, Eiji FUJIWARA
openaire   +1 more source

Asymmetrical fault analysis using the bus impedance matrix

Proceedings of the Institution of Electrical Engineers, 1978
The method of the busbar impedance matrix is applied to the solution of asymmetrical faults through the use of sequence impedances and Kron's constraint matrix. An algorithm is proposed to facilitate the routine solution of complex configurations including simultaneous and cross-country faults.
C.B. Gray, P.N.P. Singh
openaire   +1 more source

Efficient Fault Tolerance for Stateful Serverless Computing with Asymmetric Logging

ACM Transactions on Computer Systems
Serverless computing separates function execution from state management. Simple retry-based fault tolerance might corrupt the shared state with duplicate updates. Existing solutions employ log-based fault tolerance to achieve exactly-once semantics, where every single read or write to the external state is associated with a log for deterministic replay.
Sheng Qi   +3 more
openaire   +2 more sources

Open transistor fault detection in asymmetric multilevel inverter

2015 IEEE International Conference on Signal Processing, Informatics, Communication and Energy Systems (SPICES), 2015
The number of power semiconductor switches and DC sources will increase with the increase in the number of levels of output voltage of the multilevel inverter. As the number of power semiconductor switches increases, the possibility of its failure and hence the breakdown of the inverter operation also escalate in a nonlinear manner.
Nithin Raj, Saly George, G Jagadanand
openaire   +1 more source

Fast generator protection against internal asymmetrical faults

IEEE Transactions on Power Apparatus and Systems, 1977
An on-line digital computer technique for the protection of a generator against internal asymmetrical faults is described in this paper. The proposed technique relies on the detection of a second harmonic component in the field current at the onset of a fault in the armature winding.
P.K. Dash, O.P. Malik, G.S. Hope
openaire   +1 more source

Detection of Symmetrical/Asymmetrical Faults with DULR and XGBoost

2022 IEEE 6th International Conference on Condition Assessment Techniques in Electrical Systems (CATCON), 2022
Megha Mundra   +2 more
openaire   +1 more source

Synchronization Instability of Inverter-Based Generation During Asymmetrical Grid Faults

IEEE Transactions on Power Systems, 2022
Xiuqiang He, Hua Geng, Feng Liu
exaly  

Fault-Tolerant Asymmetrical Multilevel Inverter With Preserved Output Power Under Post-Fault Operation

IEEE Transactions on Industrial Electronics, 2022
Anilkumar Chappa   +4 more
openaire   +1 more source

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