Results 121 to 130 of about 241,396 (287)

System of degenerate parabolic p-Laplacian

open access: yesOpen Mathematics
In this article, we study the mathematical properties of the solution u=(u1,…,uk){\bf{u}}=({u}^{1},\ldots ,{u}^{k}) to the degenerate parabolic system ut=∇⋅(∣∇u∣p−2∇u),(p>2).{{\bf{u}}}_{t}=\nabla \hspace{0.25em}\cdot \hspace{0.25em}({| \nabla {\bf{u}}| }^
Kim Sunghoon, Lee Ki-Ahm
doaj   +1 more source

Multi‐Tissue Omics Analysis Uncovers Translational Regulation Underlying Complex Traits in Pigs

open access: yesAdvanced Science, EarlyView.
Integrated multi‐omics across pig breeds and tissues reveals key principles of post‐transcriptional translational regulation and their contribution to trait formation. A gene network framework integrating transcriptomic and translatomic data is developed and applied to elucidate the genetic basis of meat production, offering new insights into mammalian
Chao Wang   +13 more
wiley   +1 more source

Oscillation and asymptotic behaviour of a higher order neutral differential equation with positive and negative coefficients

open access: yesElectronic Journal of Differential Equations, 2008
In this paper, we obtain necessary and sufficient conditions so that every solution of $$ ig(y(t)- p(t) y(r(t))ig)^{(n)}+ q(t)G( y(g(t)))-u(t)H(y(h(t))) = f(t) $$ oscillates or tends to zero as $t o infty$, where $n$ is an integer $n geq 2$, $q>0$
Radhanath Rath   +2 more
doaj  

Tri‐Layer Solid‐State Nanopore Arrays with Crosstalk Suppression for High‐Throughput, Femtomolar‐Level Biosensing

open access: yesAdvanced Science, EarlyView.
The critical pore spacing—approximately twenty times the pore radius—required to minimize electric field coupling is determined via finite element analysis. A multi‐layered Al2O3/Au/Si3N4 nanopore structure fabricated by helium ion beam lithography is proposed, enabling quantitative analysis of the target analyte while mitigating inter‐pore crosstalk ...
Silu Feng   +5 more
wiley   +1 more source

Asymptotic behavior of the solutions of a class of second order differential systems

open access: yesElectronic Journal of Differential Equations, 2001
In the present paper it is proved that for any solution $x_1(t)$ of the system $M ddot x + dot x = f(t,x)$, for which $limlimits_{toinfty}|dot x_1(t)|=0$, there exists a solution $x_2(t)$ of the system $dot x = f(t,x)$ such that $limlimits_{toinfty}|x_1 ...
Svetoslav Ivanov Nenov
doaj  

Asymptotic behaviour of Functional Identities

open access: yes, 2012
2010 Mathematics Subject Classification: Primary 16R60, Secondary 16R10, 15A03, 15A69. We calculate the asymptotics of functional codimensions fcn(A) and generalized functional codimensions gfc n (A) of an arbitrary not necessarily associative algebra A over a field F of any characteristic.
openaire   +2 more sources

Asymptotic behaviour of positive semigroups

open access: yesMathematische Zeitschrift, 1987
For cone preserving linear operators T the asymptotic behaviour of the terms \(T^ nf/\| T^ nf\|\) as \(n\to \infty\) is reviewed. For \(C_ 0\)-semigroups \((T(t))_{t\geq 0}\) of cone preserving operators new and surprising results on the asymptotic behaviour of \(T(t)f/\| T(t)f\|\) as \(t\to \infty\) are obtained.
openaire   +1 more source

Study of Resistive Switching Dynamics and Memory States Equilibria in Analog Filamentary Conductive‐Metal‐Oxide/HfOx ReRAM via Compact Modeling

open access: yesAdvanced Electronic Materials, EarlyView.
A physics‐based compact model for Conductive‐Metal‐Oxide/HfOx ReRAM, accounting for ion dynamics, electronic conduction, and thermal effects, is presented. Accurate and versatile simulations of analog non‐volatile conductance modulation and memory state stabilization enable reliable circuit‐level studies, advancing the optimization of neuromorphic and ...
Matteo Galetta   +9 more
wiley   +1 more source

In‐Operando 4D‐STEM and STEM‐EBIC Imaging of Electric Fields and Charge Carrier Behavior in Biased Silicon p–n Junctions

open access: yesAdvanced Electronic Materials, EarlyView.
This work presents a study of how 4D‐STEM centre of mass measurements and STEM‐EBIC can be used to map the positions, directions, and strengths of electric fields in semiconductor devices. The contrast mechanisms of both techniques are tested and compared with simulations to build a robust analysis of an in situ device in the electron microscope ...
Eoin Moynihan   +5 more
wiley   +1 more source

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