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Measurement Methods in Atomic Force Microscopy
2011This chapter is introductory to the measurements: it explains different measurement techniques both for imaging and for force spectroscopy, on which most of the AFM experiments rely. It gives a general overview of the different techniques and of the output expected from the instrument; therefore it is, at a basic level, a good tool to properly start a ...
Torre, B. +3 more
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Atomic force microscopy and chemical force microscopy of microbial cells
Nature Protocols, 2008Over the past years, atomic force microscopy (AFM) has emerged as a powerful tool for imaging the surface of microbial cells with nanometer resolution, and under physiological conditions. Moreover, chemical force microscopy (CFM) and single-molecule force spectroscopy have enabled researchers to map chemical groups and receptors on cell surfaces ...
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Combined Atomic Force Microscopy and Fluorescence Microscopy
2011The atomic force microscope (AFM) is a high-resolution scanning-probe instrument which has become an important tool for cellular and molecular biophysics in recent years, but lacks the time resolution and functional specificities offered by fluorescence microscopic techniques.
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Introduction to Atomic Force Microscopy
2017Atomic force microscopy (AFM) is a scanning probe microscopy developed in the 80s by Gerd Binnig, Calvin Quate and Christoph Gerber. It is certainly the most versatile scanning probe microscopy because it can be employed in many environments, from vacuum (to investigate surfaces with atomic resolution), to aqueous solution (for experiments in biology).
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Force spectroscopy of single cells using atomic force microscopy
Nature Reviews Methods Primers, 2021Albertus Viljoen +2 more
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Generation, manipulation and characterization of molecules by atomic force microscopy
Nature Reviews Chemistry, 2017Leo Gross, Niko Pavliček
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Application of atomic force microscopy in microscopic analysis of polysaccharide
Trends in Food Science and Technology, 2019Shao-Ping Nie, Junqiao Wang
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Harnessing the damping properties of materials for high-speed atomic force microscopy
Nature Nanotechnology, 2015Georg E Fantner +2 more
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Energy dissipation in tapping-mode atomic force microscopy
Applied Physics Letters, 1998Boris Anczykowski
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