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Introduction to Atomic Force Microscopy

2017
Atomic force microscopy (AFM) is a scanning probe microscopy developed in the 80s by Gerd Binnig, Calvin Quate and Christoph Gerber. It is certainly the most versatile scanning probe microscopy because it can be employed in many environments, from vacuum (to investigate surfaces with atomic resolution), to aqueous solution (for experiments in biology).
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Atomic force microscopy and chemical force microscopy of microbial cells

Nature Protocols, 2008
Over the past years, atomic force microscopy (AFM) has emerged as a powerful tool for imaging the surface of microbial cells with nanometer resolution, and under physiological conditions. Moreover, chemical force microscopy (CFM) and single-molecule force spectroscopy have enabled researchers to map chemical groups and receptors on cell surfaces ...
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Force spectroscopy of single cells using atomic force microscopy

Nature Reviews Methods Primers, 2021
Albertus Viljoen   +2 more
exaly  

Generation, manipulation and characterization of molecules by atomic force microscopy

Nature Reviews Chemistry, 2017
Leo Gross, Niko Pavlicek, Gross Leo
exaly  

Harnessing the damping properties of materials for high-speed atomic force microscopy

Nature Nanotechnology, 2015
Georg Fantner   +2 more
exaly  

Application of atomic force microscopy in microscopic analysis of polysaccharide

Trends in Food Science and Technology, 2019
Junqiao Wang
exaly  

Atomic Force Microscopy

Journal of the Japan Society of Colour Material, 2020
Ken NAKAJIMA   +4 more
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Energy dissipation in tapping-mode atomic force microscopy

Applied Physics Letters, 1998
Cleveland J P
exaly  

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