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Acoustic Microscopy by Atomic Force Microscopy

Applied Physics Letters, 1994
We have constructed an atomic force microscope enabling one to image the topography of a sample, and to monitor simultaneously ultrasonic surface vibrations in the MHz range. For detection of the distribution of the ultrasonic vibration amplitude, a part of the position-sensing light beam reflected from the cantilever is directed to an external knife ...
Walter Arnold, Ute Rabe
openaire   +2 more sources

Capillary force in atomic force microscopy

The Journal of Chemical Physics, 2004
Under ambient conditions, a water meniscus generally forms between a nanoscale atomic force microscope tip and a hydrophilic surface. Using a lattice gas model for water and thermodynamic integration methods, we calculate the capillary force due to the water meniscus for both hydrophobic and hydrophilic tips at various humidities.
Joonkyung Jang   +2 more
openaire   +3 more sources

Hyphenating Atomic Force Microscopy

Analytical Chemistry, 2014
Atomic force microscopy can be readily combined with complementary instrumental techniques ranging from optical to mass-sensitive methods. This Feature highlights recent advances on hyphenated AFM technology, which enables localized studies and mapping of complementary information at surfaces and interfaces.
Alexander Eifert, Christine Kranz
openaire   +3 more sources

Atomic Force Microscopy as Nanorobot

2011
Atomic force microscopy (AFM) is a powerful and widely used imaging technique that can visualize single molecules under physiological condition at the nanometer scale. In this chapter, an AFM-based nanorobot for biological studies is introduced.
Liu, Lianqing   +8 more
openaire   +5 more sources

Nanofabrication with Atomic Force Microscopy

Journal of Nanoscience and Nanotechnology, 2004
Atomic force microscopy (AFM) was developed in 1986. It is an important and versatile surface technique, and is used in many research fields. In this review, we have summarized the methods and applications of AFM, with emphasis on nanofabrication. AFM is capable of visualizing surface properties at high spatial resolution and determining biomolecular ...
Qian Tang, Li Min Zhou, San-Qiang Shi
openaire   +3 more sources

Atomic Force Microscopy of Viruses

2019
Atomic force microscopy employs a nanometric tip located at the end of a micro-cantilever to probe surface-mounted samples at nanometer resolution. Because the technique can also work in a liquid environment it offers unique possibilities to study individual viruses under conditions that mimic their natural milieu.
P. J. de Pablo, Iwan A. T. Schaap
openaire   +3 more sources

Atomic Force Microscopy

Journal of the Japan Society of Colour Material, 2020
Physicists at the Swiss Nanoscience Institute and the University of Basel have succeeded in measuring the very weak van der Waals forces between individual atoms for the first time.
K. Nakajima   +4 more
semanticscholar   +2 more sources

Atomic Force Microscopy of Viruses

2013
Atomic force microscopy (AFM) makes it possible to obtain images at nanometric resolution, and to accomplish the manipulation and physical characterization of specimens, including the determination of their mechanical and electrostatic properties. AFM has an ample range of applications, from materials science to biology.
openaire   +4 more sources

Atomic Force Microscopy of Proteins

2019
Atomic force microscopy (AFM) enables imaging of surface-deposited proteins and protein structures under physiological conditions, which is a benefit compared to ultra-high vacuum techniques such as electron microscopy. AFM also has the potential to provide more information from the phase in tapping mode or from functional AFM modes.
Yiran An   +4 more
openaire   +2 more sources

Nanorheology by atomic force microscopy

Review of Scientific Instruments, 2014
We present an Atomic Force Microscopy (AFM) based method to investigate the rheological properties of liquids confined within a nanosize gap formed by an AFM tip apex and a solid substrate. In this method, a conventional AFM cantilever is sheared parallel to a substrate surface by means of a lock-in amplifier while it is approaching and retracting from
Deborah Ortiz-Young   +3 more
openaire   +3 more sources

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