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Measurement Methods in Atomic Force Microscopy
2011This chapter is introductory to the measurements: it explains different measurement techniques both for imaging and for force spectroscopy, on which most of the AFM experiments rely. It gives a general overview of the different techniques and of the output expected from the instrument; therefore it is, at a basic level, a good tool to properly start a ...
Torre, B. +3 more
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Atomic Force Microscopy for Molecular Structure Elucidation.
Angewandte Chemie, 2018L. Gross +7 more
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Noise in Atomic Force Microscopy
2015In topographic images, the noise in the vertical position of the tip (i.e. the noise in the tip-sample distance) should be considerably smaller than the topography signal on the sample which we want to measure.
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Static Atomic Force Microscopy
2015In static atomic force microscopy the force between the tip and sample leads to a deflection of the cantilever according to Hooke’s law.
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Conductive Atomic Force Microscopy
Atomic Force Microscopy, 2019Wesley C. Sanders
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Advances in Atomic Force Microscopy for Probing Polymer Structure and Properties
, 2018Dong Wang, Thomas P. Russell
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Electrochemical ion insertion from the atomic to the device scale
Nature Reviews Materials, 2021Aditya Sood +2 more
exaly
Heavy Oil Based Mixtures of Different Origins and Treatments Studied by Atomic Force Microscopy
, 2017B. Schuler +15 more
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Unraveling the Molecular Structures of Asphaltenes by Atomic Force Microscopy.
Journal of the American Chemical Society, 2015B. Schuler +4 more
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