Results 61 to 70 of about 129,486 (213)

Stripe noise removal in conductive atomic force microscopy

Scientific Reports
Conductive atomic force microscopy (c-AFM) can provide simultaneous maps of the topography and electrical current flow through materials with high spatial resolution and it is playing an increasingly important role in the characterization of novel ...
Mian Li, Jan Rieck, Beatriz Noheda, Jos B. T. M. Roerdink, Michael H. F. Wilkinson   +4 more
doaj   +1 more source

Charge density waves of 1T-TaS2 imaged by atomic force microscopy [PDF]

, 1990
R. C. Barrett, J. Nogami, C. F. Quate
openalex   +1 more source

Atomic Force Microscopy: Step Height Measurement Uncertainty Evaluation

Tehnički Glasnik
The atomic force microscope (AFM) enables the measurement of sample surfaces at the nanoscale. Reference standards with calibration gratings are used for the adjustment and verification of AFM measurement devices.
Andrej Razumić, Biserka Runje, Dragutin Lisjak, Davor Kolar, Amalija Horvatić Novak, Branko Štrbac, Borislav Savković   +6 more
doaj   +1 more source

Scanning force microscopy - With Applications to Electric, Magnetic and Atomic Forces [PDF]

, 1991
Dror Sarid, R. Coratger, F. Ajustron, Jacques Beauvillain   +3 more
openalex   +1 more source

Atomic force microscopy produces faithful high-resolution images of protein surfaces in an aqueous environment. [PDF]

, 1994
Stefan Karrasch, R. Hegerl, Jan H. Hoh, Wolfgang Baumeister, Andreas Engel   +4 more
openalex   +1 more source

Imaging and modification of polymers by scanning tunneling and atomic force microscopy

, 1988
T. R. Albrecht, Moris Dovek, C. A. Lang, Peter Grütter, C. F. Quate, S. W. J. Kuan, C. W. Frank, R. F. W. Pease   +7 more
openalex   +2 more sources

In Situ Observations of Shape Evolution during Copper Dissolution Using Atomic Force Microscopy [PDF]

, 1992
Brandon J. Cruickshank, Andrew A. Gewirth, Rebecca M. Rynders, Richard C. Alkire   +3 more
openalex   +1 more source

Noncontact atomic force microscopy III

Beilstein Journal of Nanotechnology, 2016
Mehmet Z. Baykara, Udo D. Schwarz
doaj   +1 more source

Immobilized proteins in buffer imaged at molecular resolution by atomic force microscopy

, 1990
A. L. Weisenhorn, B. Drake, Craig Prater, S. A. C. Gould, Paul K. Hansma, F. Ohnesorge, M. Egger, S. P. Heyn, H. E. Gaub   +8 more
openalex   +1 more source

Morphological Investigations on Carbon-Black Particles by Atomic Force Microscopy [PDF]

, 1994
W. Niedermeier, J. Stierstorfer, Stefan Kreitmeier, Oliver Metz, D. Göritz   +4 more
openalex   +1 more source