Results 111 to 120 of about 602,867 (270)
New Journal of Physics, 2015 Few-photon ionization and relaxation processes in acetylene (C _2 H _2 ) and ethane (C _2 H _6 ) were investigated at the linac coherent light source x-ray free electron laser (FEL) at SLAC, Stanford using a highly efficient multi-particle correlation ...
M Mucke +32 more
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Auger analysis of a fiber/matrix interface in a ceramic matrix composite [PDF]
Auger electron spectroscopy (AES) depth profiling was used to characterize the fiber/matrix interface of an SiC fiber, reaction bonded Si3N4 matrix composite. Depth profiles of the as received double coated fiber revealed concentration oscillations which
Honecy, Frank S., Pepper, Stephen V.
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, 2014 Citation: 'Auger electron spectroscopy' in the IUPAC Compendium of Chemical Terminology, 3rd ed.; International Union of Pure and Applied Chemistry; 2006. Online version 3.0.1, 2019. 10.1351/goldbook.A00522 • License: The IUPAC Gold Book is licensed under Creative Commons Attribution-ShareAlike CC BY-SA 4.0 International for individual terms.
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Auger Parameter Analysis for TiN and AlN Thin Films via Combined In Situ XPS and HAXPES
Surface and Interface Analysis, EarlyView.ABSTRACT Auger parameter analysis provides in‐depth information about electronic and chemical bonding properties of TiN and AlN thin films, which are relevant across a wide range of technologies. Meaningful interpretation and analysis of Auger parameter of these materials have been hindered due to, among other reasons, the absence of reliable ...
O. V. Pshyk +3 more
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A fundamental approach to adhesion: Synthesis, surface analysis, thermodynamics and mechanics [PDF]
Adherend surfaces and fractography were studied using electron spectroscopy for chemical analysis and scanning electron microscopy/energy dispersive analysis of X-rays. In addition, Auger Electron Spectroscopy with depth profiling capability was used. It
Chen, W., Wightman, J. P.
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Quantitative Auger Electron Spectroscopy
Hyomen Kagaku, 1986 A short review of surface chemical analysis by Auger Electron Spectroscopy is presented. Following a brief ntroduction of the basis of quantification in AES, each of the Auger parameters causing inaccuracies in measurements is discussed. These include both specimen and instrument dependent parameters.
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Surface and Interface Analysis, EarlyView.ABSTRACT Internal scattering within hemispherical electron analyzers (HEA) is common when operating at low pass energies, where the instrument resolution of X‐ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy experiments are at their best.
J. Laverock, N. A. Fox
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Small, EarlyView.Hydrogenated Au@Cu2O/TiO2 nanocrystals with oxygen‐vacancy‐engineered heterostructures enable efficient hot‐electron transfer. A Z‐scheme heterojunction forms between TiO2 and Cu2O, suppressing electron‐hole recombination and leading to a hydrogen evolution rate of 9.3 mmol g−1 h−1, with AQYs of 2.5% at 650 nm and 0.8 % at 800 nm, extending activity ...
Tsai‐Te Wang +9 more
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Small, EarlyView.The elemental composition of a series of laboratory graphene oxide and reduced graphene oxide materials and a commercial graphene oxide material of high quality is analyzed with the standardless SEM/EDS quantification. XPS is used as a reference method.
Paul Mrkwitschka +7 more
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Growth of bilayer transition metal dichalcogenides at controlled locations
APL MaterialsLayered transition metal dichalcogenide (TMD) materials have attracted great interest for applications in electronics. Here, we report a method to synthesize TMD materials at controlled locations with the desired layer number.
Chengyu Wen +6 more
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