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Auger Electron Spectroscopy

Vacuum, 1994
Different energetic beams can be used for excitation of solids with the creation of holes in electronic levels: photons, ions, electrons. In this chapter only the electron impact excitation will be taken into account, but many of the conclusions can easily be extended to other excitation modes.
Bertolini, J.C., Massardier, J.
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Auger electron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena, 1986
Abstract This article describes the principles and applications of Auger electron spectroscopy (AES). It provides information on the instrumentation typically used in the AES, including an electron gun, an electron spectrometer, a secondary electron detector, and an ion gun. The article also describes experimental methods and limitations
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Auger Electron Spectroscopy

1975
When a vacancy is formed in one of the inner shells of an atom, it may be filled by either a radiative (x ray) or nonradiative (Auger) process. In most instances nature chooses the Auger process. Only when the transition energy exceeds roughly 10 keV is x-ray emission predominant.
A. JOSHI, L.E. DAVIS, P.W. PALMBERG
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Auger electron spectroscopy

Contemporary Physics, 1973
Abstract Auger spectroscopy has progressed from its initial use as a purely research tool to that of an analytical technique of general application wherever information about the composition of non-volatile surfaces is important. This, article describes the underlying physics of the Auger process and the instrumentation involved, discusses the reasons ...
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Spin-polarized Auger-electron spectroscopy

Physical Review B, 1987
A comprehensive review of spin-polarized Auger-electron spectroscopy on 3d transition-metal ferromagnets is presented. The kind of information obtained from the Auger-electron spin polarization depends on the particular transition involved. Decays with emission of a valence electron probe the local magnetization at the site where the transition occurs.
, Allenspach   +3 more
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Auger Electron Spectroscopy

1999
Auger Electron Spectroscopy (AES)1, 2, 3, 4, 5, 6 is an essential tool for analyzing failed IC’s where surface characterization is required. It provides elemental identification and, in some cases, chemical information about substances in highly localized areas in very near-surface regions of materials, thin films, or film interfaces.
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Scanning electron excited Auger electron spectroscopy

Applications of Surface Science, 1979
Abstract A scanning Auger spectrometer can be operated in a number of modes including scanning electron microscopy, Auger point analysis, Auger line scan analysis, Auger mapping and depth profiling. These modes of operation are briefly discussed and demonstrated, with application to cathode studies wherever possible.
T.W. Haas, J.T. Grant
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Quantitative Auger Electron Spectroscopy

1983
Publisher Summary This chapter reviews Auger electron emission from a target subjected to electron bombardment. It is noted that the chapter considers the Auger electron spectroscopy (AES) without reference to the excitation mode throughout, in order to denote the analysis technique developed for electron-induced Auger electron emission.
M. Cailler, J.P. Ganachaud, D. Roptin
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Auger Electron Spectroscopy

Journal of the Japan Society of Colour Material, 2013
Kazutoshi MAMIYA, Noriaki SANADA
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