Results 51 to 60 of about 200 (87)

WEDGE-Net: Wavelet-Driven Memory-Efficient Anomaly Detection for Industrial Edge Computing. [PDF]

Sensors (Basel)
Park JM, Kim GY.
europepmc   +1 more source

A multi-cognitive PCB defect detection model integrating Mamba. [PDF]

Sci Rep
Jin L, Feng Y, Yang H, Liu S.
europepmc   +1 more source

Integrated Automatic Optical Inspection and Image Processing Procedure for Smart Sensing in Production Lines. [PDF]

Sensors (Basel)
Qiu RQ, Tsai ML, Chen YW, Singh SP, Lo CY.   +4 more
europepmc   +1 more source

Enhancing Data Collection Through Optimization of Laser Line Triangulation Sensor Settings and Positioning. [PDF]

Sensors (Basel)
Heczko D, Chlebek J, Mlotek J, Kot T, Scalera L, Dekan M, Zeman Z, Bobovský Z.   +7 more
europepmc   +1 more source

Changes in biofield measures and experienced states during meditation and breathwork practices: an uncontrolled feasibility study. [PDF]

Front Psychol
Dyer NL, Sprengel ML, Stuldreher I, van der Sanden K, Brouwer AM, Velut S, Ives JA, Yan Y, van Wijk E.   +8 more
europepmc   +1 more source

ResNet-SE-CBAM Siamese Networks for Few-Shot and Imbalanced PCB Defect Classification. [PDF]

Sensors (Basel)
Hsiao CH, Su HC, Wang YT, Hsu MJ, Hsu CC.   +4 more
europepmc   +1 more source

Soldering and Bonding in Contemporary Electronic Device Packaging. [PDF]

Materials (Basel)
Li Y, Pan B, Ge Z, Chen P, Bi B, Yi X, Wu C, Wang C.   +7 more
europepmc   +1 more source

RootXplorer: A computer vision-based 3D phenotyping platform for high-throughput quantification and spatio-temporal analysis of root system penetrability. [PDF]

Plant Phenomics
Bello Bello E, Wang L, Patil SB, Rajurkar AB, Funaro L, Echegoyen K, Pariyar S, Berrigan EM, Torres J, Rico-Cambron TY, Torres-Cisneros LA, Gerth S, Herrera-Estrella L, Busch W.   +13 more
europepmc   +1 more source

Comparison of Different NDT Techniques for Evaluation of the Quality of PCBs Produced Using Traditional vs. Additive Manufacturing Technologies. [PDF]

Sensors (Basel)
Jasiūnienė E, Raišutis R, Samaitis V, Jankauskas A.   +3 more
europepmc   +1 more source

YOLOSeg with applications to wafer die particle defect segmentation. [PDF]

Sci Rep
Li YT, Chan YC, Huang CC, Hsu YC, Chen SH.   +4 more
europepmc   +1 more source