Results 71 to 80 of about 19,898 (183)

Du bist GENial! [PDF]

open access: yes, 2011
DU BIST GENIAL! Forscher (Rights reserved) (-) Ausgabe 2011,1 Du bist GENial! (Rights reserved) (-

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Borsa İstanbul’da Hisse Geri Alım Kararlarına İlişkin Ampirik Bir Analiz

open access: yesEkonomi, Politika & Finans Araştırmaları Dergisi
Bu çalışma, hisse geri alım kararlarının 2022-2023 yıllarında Borsa İstanbul'da işlem gören 95 şirketin hisse değerleri üzerindeki etkisini analiz etmektedir. Çalışmanın amacı, hisse geri alım kararlarının hisse fiyatları ve piyasa performansı üzerindeki
Necla İlter Küçükçolak   +2 more
doaj   +1 more source

Low Power Technology of BIST Testability Design

open access: yes, 2003
在BIST测试过程中,测试电路的加入使得数字系统的功耗明显加大,低功耗的BIST设计得到人们的广泛关注。本文介绍几种BIST的低功耗设计技术 ...
李金凤, 汪滢, 辛晓宁
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TEM Exploration of High-Performance Non-Noble Metal Catalysts for OER [PDF]

open access: yesBIO Web of Conferences
Rauret David Llorens   +4 more
doaj   +1 more source

Empirical investigation of market efficiency in the Borsa İstanbul electricity, gas, and water sector

open access: yesIstanbul Business Research
Exploring the efficiency of financial markets has remained a prominent area of interest for researchers and market participants. However, the debate on market efficiency continues, with studies examining different sectors and markets to assess the ...
Mehmet Beyazgül   +2 more
doaj   +1 more source

Relationship between Financial Services Confidence Index and Stock Market Returns: Toda-Yamamoto and Asymmetric Causality Analysis

open access: yesEkoist Journal of Econometrics and Statistics
The management of expectations is a critical factor in shaping the dynamics of financial markets. Therefore, changes in confidence indices, which reflect the expectations of economic agents, are closely monitored by economists.
Yunus Emre Turan, Dinara Zubaidullina
doaj   +1 more source

BIST Techniques and Its Applications in Memory

open access: yes, 2003
阐述内建自检测(BIST)技术的特点、结构和原理 ...
马纪虎, 汪滢, 王宏, 李晓宁
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Testability Trade-offs for BIST Data Paths

open access: yes, 2004
Nicola Nicolici   +3 more
core   +2 more sources

Transparent BIST for RAMs

open access: yes, 1992
ISBN: 0780307607A technique allowing the transformation of any RAM test algorithm to a transparent built-in self-test (BIST) algorithm is described. At the end of the test session the contents of the RAM are equal to its initial contents.
Nicolaidis, M.
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