Results 231 to 240 of about 945,073 (267)
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Bounds on pseudoexhaustive test lengths
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1998Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we have derived both generic (cone-independent) and circuit-specific (cone-dependent) bounds on the minimal length of a test required so that each cone in a circuit is exhaustively tested.
Rajagopalan Srinivasan +2 more
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Testing for Bounded Faults in RAMs
Journal of Electronic Testing, 1997We study the class of “bounded faults” in random-access memories; these are faults that involve a bounded number of cells. This is a very general class of memory faults that includes, for example, the usual stuck-at, coupling, and pattern-sensitive faults, but also many other types of faults. Some bounded faults are known to require deterministic tests
René David +2 more
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Testing Outerplanarity of Bounded Degree Graphs
Algorithmica, 2010zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Yuichi Yoshida, Hiro Ito
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Property Testing in Bounded Degree Graphs
Algorithmica, 1997zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Oded Goldreich 0001, Dana Ron
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A lower bound for testing 3-colorability in bounded-degree graphs
The 43rd Annual IEEE Symposium on Foundations of Computer Science, 2002. Proceedings., 2003We consider the problem of testing 3-colorability in the bounded-degree model. We show that, for small enough /spl epsiv/, every tester for 3-colorability must have query complexity /spl Omega/(n). This is the first linear lower bound for testing a natural graph property in the bounded-degree model.
Andrej Bogdanov +2 more
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An upper bound on software testing effectiveness
ACM Transactions on Software Engineering and Methodology, 2008Failure patterns describe typical ways in which inputs revealing program failure are distributed across the input domain—in many cases, clustered together in contiguous regions. Based on these observations several debug testing methods have been developed.
Tsong Yueh Chen, Robert G. Merkel
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Self-test scheduling with bounded test execution time
Proceedings International Test Conference 1992, 1992Complex VLSI circuits with built-in self-test resources are segmented into a number of subcircuits, that to some extent can be tested concurrently. For each subcircuit a signature is collected. The test schedule has to organize the test execution such that the available resources are optimally utilized.
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Bounds for threshold and majority group testing
2011 IEEE International Symposium on Information Theory Proceedings, 2011We consider two generalizations of group testing: threshold group testing (introduced by Damaschke [8]) and majority group testing (a further generalization, including threshold group testing and a model introduced by Lebedev [15]).
Rudolf Ahlswede +2 more
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Bounds on 2-Query Codeword Testing
2003We present upper bounds on the size of codes that are locally testable by querying only two input symbols. For linear codes, we show that any 2-locally testable code with minimal distance δn over any finite field \(\mathbb{F}\) cannot have more than \(|\mathbb{F}|^{3/\delta}\) codewords. This result holds even for testers with two-sided error.
Eli Ben-Sasson +2 more
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A Series of Lower Bounds to the Reliability of a Test
Psychometrika, 1978Two well-known lower bounds to the reliability in classical test theory, Guttman’s λ2 and Cronbach’s coefficient alpha, are shown to be terms of an infinite series of lower bounds. All terms of this series are equal to the reliability if and only if the test is composed of items which are essentially tau-equivalent.
ten Berge, J.M.F., Zegers, F.E.
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