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Bounds on pseudoexhaustive test lengths
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1998Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we have derived both generic (cone-independent) and circuit-specific (cone-dependent) bounds on the minimal length of a test required so that each cone in a circuit is exhaustively tested.
R. Srinivasan, S.K. Gupta, M.A. Breuer
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Finite-Frequency Identification: Test Frequency Bounds
Automation and Remote Control, 2001zbMATH Open Web Interface contents unavailable due to conflicting licenses.
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Probability lower bounds for USP/NF tests
Journal of Biopharmaceutical Statistics, 2002In the pharmaceutical industry, a number of tests such as content uniformity and dissolution testing are usually performed at various stages of drug manufacturing process to ensure that the drug product meets standards for identity, strength, quality, purity, and stability of the drug product as specified in the United States Pharmacopedia and National
Shein-Chung, Chow +2 more
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Testing Exact Upper Bounds to Exact Exchange
Journal of Chemical Theory and Computation, 2017The exact exchange energy and its energy density are useful but computationally expensive ingredients in density functional approximations for Kohn-Sham density functional theory. We present detailed tests of some exact nonempirical upper bounds to exact exchange.
Emil Proynov, Benjamin G. Janesko
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Exact Confidence Bounds Following Adaptive Group Sequential Tests
Biometrics, 2009Summary We provide a method for obtaining confidence intervals, point estimates, and p‐values for the primary effect size parameter at the end of a two‐arm group sequential clinical trial in which adaptive changes have been implemented along the way. The method is based on applying the adaptive hypothesis testing procedure of Müller and Schäfer (2001 ...
Brannath, Werner +2 more
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Self-test scheduling with bounded test execution time
Proceedings International Test Conference 1992, 1992Complex VLSI circuits with built-in self-test resources are segmented into a number of subcircuits, that to some extent can be tested concurrently. For each subcircuit a signature is collected. The test schedule has to organize the test execution such that the available resources are optimally utilized.
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Dynamic rate bound acceptance test approaches
1999 European Control Conference (ECC), 1999In this paper, an effective dynamic rate bound acceptance test approach is developed. The acceptance test performs a reasonableness check on the controller outputs, based upon critical control theory which leads to least upper bounds of the controller output.
R. Stroph, T. Clarke
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A lower bound for testing juntas
Information Processing Letters, 2004zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Chockler, Hana, Gutfreund, Dan
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Complexity Bounded Martin-Löf Tests
1987One of the main ways of attacking the famous P = ?NP problem and its associates consists in the consideration of some classical tools from the recursive function theory (different kind of reducibilities, relativization, immunity, a.s.o.) in complexity bounded forms.
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TESTING COVARIANT ENTROPY BOUNDS
New Worlds in Astroparticle Physics, 2006SIJIE GAO, JOSÉ P. S. LEMOS
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