Results 261 to 270 of about 6,910,975 (305)

Population-scale disease-associated tandem repeat analysis reveals locus and ancestry-specific insights. [PDF]

open access: yesNat Commun
Rajan-Babu IS   +5 more
europepmc   +1 more source

Structural studies and functional engineering of NanX: an anhydro‐sialic acid transporter from Escherichia coli

open access: yesFEBS Open Bio, EarlyView.
Biophysical characterisation shows that NanX, a membrane transport protein from the major facilitator superfamily (MFS), forms both monomers and dimers after purification. AlphaFold modelling and substrate docking provide information on residues likely involved in substrate recognition for NanX and another MFS member, NanT.
Michael C. Newton‐Vesty   +13 more
wiley   +1 more source

The Effects of Plyometric Training on Selected Neuromuscular Outcomes in Trained-to-Highly Trained Male Boulder Climbers: A Preliminary Exploratory Trial. [PDF]

open access: yesSports (Basel)
Cortés-Roco G   +6 more
europepmc   +1 more source

Protein thiol alterations drive pathologic liquid-liquid phase separation in the aging brain. [PDF]

open access: yesNat Struct Mol Biol
Vignane T   +32 more
europepmc   +1 more source

A monocyte-centered framework for predicting immunochemotherapy efficacy in lung squamous cell carcinoma patients. [PDF]

open access: yesEMBO Mol Med
Zhao J   +12 more
europepmc   +1 more source

Testing for Bounded Faults in RAMs

Journal of Electronic Testing, 1997
We study the class of “bounded faults” in random-access memories; these are faults that involve a bounded number of cells. This is a very general class of memory faults that includes, for example, the usual stuck-at, coupling, and pattern-sensitive faults, but also many other types of faults. Some bounded faults are known to require deterministic tests
René David   +2 more
openaire   +2 more sources

Bounds on pseudoexhaustive test lengths

IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1998
Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we have derived both generic (cone-independent) and circuit-specific (cone-dependent) bounds on the minimal length of a test required so that each cone in a circuit is exhaustively tested.
Rajagopalan Srinivasan   +2 more
openaire   +2 more sources

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