Population-scale disease-associated tandem repeat analysis reveals locus and ancestry-specific insights. [PDF]
Rajan-Babu IS +5 more
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Biophysical characterisation shows that NanX, a membrane transport protein from the major facilitator superfamily (MFS), forms both monomers and dimers after purification. AlphaFold modelling and substrate docking provide information on residues likely involved in substrate recognition for NanX and another MFS member, NanT.
Michael C. Newton‐Vesty +13 more
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The Effects of Plyometric Training on Selected Neuromuscular Outcomes in Trained-to-Highly Trained Male Boulder Climbers: A Preliminary Exploratory Trial. [PDF]
Cortés-Roco G +6 more
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Protein thiol alterations drive pathologic liquid-liquid phase separation in the aging brain. [PDF]
Vignane T +32 more
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Distributed Kalman Filter with Maximum Correlation Entropy Criterion and Consensus Weighted Term Fusion. [PDF]
Feng X, Gao Z, Liu T.
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A monocyte-centered framework for predicting immunochemotherapy efficacy in lung squamous cell carcinoma patients. [PDF]
Zhao J +12 more
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When Does Score Fusion Help? Conformally Certified Out-of-Distribution Detection for Camera and LiDAR Sensors. [PDF]
Szabó L, Weltsch Z, Ádámné-Major A.
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Improving Sensitivity Analysis By Synthesizing Randomized Clinical Trials With Limited Overlap. [PDF]
Jiang K, Hu W, Lai X, Yang S, Zhou XH.
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Testing for Bounded Faults in RAMs
Journal of Electronic Testing, 1997We study the class of “bounded faults” in random-access memories; these are faults that involve a bounded number of cells. This is a very general class of memory faults that includes, for example, the usual stuck-at, coupling, and pattern-sensitive faults, but also many other types of faults. Some bounded faults are known to require deterministic tests
René David +2 more
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Bounds on pseudoexhaustive test lengths
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1998Pseudoexhaustive testing involves applying all possible input patterns to the individual output cones of a combinational circuit. Based on our new algebraic results, we have derived both generic (cone-independent) and circuit-specific (cone-dependent) bounds on the minimal length of a test required so that each cone in a circuit is exhaustively tested.
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