Results 181 to 190 of about 89,505 (296)
Li Incorporation Induces Surface Chemical Disorder in Solution‐Processed Cu2ZnSn(S,Se)4
Lithium incorporation into Cu2ZnSn(S,Se)4 (CZTSSe) thin‐film semiconductors is highly beneficial for solar power conversion efficiencies, although directly visualising its impact on the absorber is difficult. Energy‐filtered photoemission electron microscopy measurements reveal lithium alloying induces surface chemical disorder of CZTSSe, highlighted ...
Alice Sheppard +9 more
wiley +1 more source
Anomalous X-ray diffraction on hybrid perovskite thin films: results and challenges. [PDF]
Merten L +8 more
europepmc +1 more source
The N concentration in an epitaxial VN bilayer is tailored from overstoichiometric V0.49N0.51 to understoichiometric V0.56N0.44. Based on ab initio, diffraction, and microscopy data, the overstoichiometric V0.49N0.51 layer contains V vacancies, N Frenkel pairs, and a high density of dislocations.
Marcus Hans +7 more
wiley +1 more source
Topological photonics for single-photon sources. [PDF]
Ding F.
europepmc +1 more source
In situ SAXS/WAXS enables real‐time tracking of nanoparticle formation and evolution in exsolved and infiltrated Ni‐based perovskites under reducing conditions. The combined technique captures nucleation, growth, and coarsening dynamics with high temporal resolution, providing statistically robust insights into structural and morphological ...
Elena Vicente +4 more
wiley +1 more source
FaXToR: the hard X-ray micro-tomography beamline at the Spanish synchrotron ALBA. [PDF]
Patera A +8 more
europepmc +1 more source
This study investigates the thermochromic properties of VO2 deposited on aluminum doped zinc oxide precoated fused silica with Al2O3, TiO2, and WO3 as interface layers. The results indicate that the metal‐to‐insulator transition is highly influenced by the grains formed at the interface.
Eduard Llorens Balada, Eugen Stamate
wiley +1 more source
TRIXS: a multilayer grating solution towards highly efficient resonant inelastic tender X-ray scattering. [PDF]
Zhou KJ +15 more
europepmc +1 more source
Micro‐Laue diffraction and excited optical X‐ray luminescence are used to study InGaN/GaN core‐shell wires on the BM32 beamline at the European Synchrotron. Multimodal imaging of X‐ray fluorescence, deviatoric strain tensors and optical emissions is performed using simultaneous mapping.
Beatriz de Goes Foschiani +5 more
wiley +1 more source
Measurement of microdosimetric spectra of high-LET particle beams using the ENCORE detector. [PDF]
Hartzell S +6 more
europepmc +1 more source

