Results 201 to 210 of about 228,369 (266)

Patient-reported BREAST-Q Outcomes of Chest Wall Perforator Flaps in Partial Breast Reconstruction: A Single-center Experience. [PDF]

Plast Reconstr Surg Glob Open
Moses O, Yilmaz D, Chin JS, Cooduvalli P, Hashmi D, Elsehimy M, Faheem M, Ullah MZ, Aggarwal S.   +8 more
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Non-diagnostic stereotactic intracranial biopsies: a 15-year institutional experience. [PDF]

J Neurooncol
Himic V, Vargas-George S, Knott MV, Govindarajan V, Tigchelaar SS, Cardinal TM, Khalafallah AM, Lu VM, Sahin HM, Lang A, Gersey ZC, Aaronson DM, Komotar RJ, Shah AH, Ivan ME.   +14 more
europepmc   +1 more source

Vacuum Breakdown Characteristics for Stainless Steel Electrode and Influence of Contamination Degree of the Electrode Surface on the Breakdown Characteristics

Vacuum Breakdown Characteristics for Stainless Steel Electrode and Influence of Contamination Degree of the Electrode Surface on the Breakdown Characteristics
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Breakdown characteristics of askarels

1971 EIC 10th Electrical Insulation Conference, 1971
Examination of the results plotted in the graphs demonstrates that they grow whilst resident on the electrode surface. Probably tions i.e. reliability against voltage, -ln R against voltage, In (-ln R) against voltage are all continuous except at a voltage of 9 kV.
F. R. J. Spitzer, J. Bulcke
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Voltage breakdown characteristics of microwave antennas

IRE International Convention Record, 1959
At low pressures, antennas are susceptible to voltage breakdown. In the case of missiles, for example, there are indications that very low power is sufficient to initiate and maintain breakdown. Since it is essential that the system performance is not interrupted for high-altitude operation, an experimental investigation has been made to study the ...
J. Chown, W. Scharfman, T. Morita
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Understanding nMOSFET Characteristics after Soft Breakdown and Their Dependence on the Breakdown Location

32nd European Solid-State Device Research Conference, 2002
Identical breakdown-position dependence of normalized currents in nFETs with 2.4 nm gate oxide is observed after soft and hard breakdowns. This suggests that electron energy is conserved in the soft breakdown path. It is concluded that the observed soft breakdown is best modeled by a lowered oxide barrier in the breakdown conduction path.
KACZER B, DEGRAEVE R, DE KEERSGIETER A, GROESENEKEN G, CRUPI, Felice   +4 more
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