Results 81 to 90 of about 235,717 (303)

Data Visualization of Budgeting Assumptions: An Illustrative Case of Trans-disciplinary Applied Knowledge [PDF]

open access: yesJournal of Systemics, Cybernetics and Informatics
Trans-disciplinary research combines different fields into new conceptual and methodological frameworks. In this study, the SECI model of knowledge creation, which consists of Socialization, Externalization, Combination, and Internalization conversion ...
Carol E. Cuthbert   +2 more
doaj  

A contemporary view of systems engineering [PDF]

open access: yes
The concept of a 'system' is defined, and the 'systems approach' is discussed. Four contemporary examples of the systems approach are presented: an operations research project, the planning-programming-budgeting system, an information processing system ...
Miles, R. F., Jr.
core   +1 more source

PENGARUH KARAKTERISTIK SISTEM DAN INDIVIDU TERHADAP PENERIMAAN SISTEM ANGGARAN UNIVERSITAS SURABAYA [PDF]

open access: yes, 2011
Nowadays, role of information technology in any aspect of human being has grown rapidly. Peoples need to quickly adapt with these situation. In fact, main factor causing failure in implementation of an information technology is the human resources ...
Sutanto, Aurelia Carina Christanti
core  

Impact of Oxygen Plasma Pre‐Treatment on Thermal Oxidation and Reliability of SiO2 on 4H‐SiC

open access: yesAdvanced Materials Interfaces, EarlyView.
We investigate how oxygen plasma pre‐treatment affects the thermal oxidation of silicon carbide. While plasma modification increases growth rates by 84%, it reduces dielectric breakdown strength by 18%. Our findings reveal that although plasma improves the interface state density, it introduces structural damage, highlighting a critical trade‐off ...
Chezhiyan Nanjappan   +3 more
wiley   +1 more source

Plasma‐Sequence‐Engineered Atomic Layer Deposition of Ultra‐Thin SiNx for Enhanced Etching Resistance in Extreme Ultraviolet Pellicles

open access: yesAdvanced Materials Interfaces, EarlyView.
Plasma‐sequence‐engineered ALD (PSE‐ALD), based on sequential NH3 and N2 plasma pulses, enables ultrathin, dense SiNx films. ToF‐MS analysis confirms ligand removal via HCl evolution, while increased film density indicates network densification. The resulting SiNx coating provides robust protection of graphite under H2 plasma exposure.
Hye‐Young Kim   +7 more
wiley   +1 more source

Planning programming budgeting systems, selected case materials [PDF]

open access: yes
Planning, programming, and budgeting system for operational planning by industrial ...
Weidenbaum, M. L.
core   +1 more source

Evolution of Materials and Device Stacks for HfO2‐Based Ferroelectric Memories

open access: yesAdvanced Materials Interfaces, EarlyView.
This review summarizes engineering strategies for HfO2 based ferroelectric memories with focus on FeCAP and FeFET structures. It describes how dopant design, stress effects, and interface engineering improve the bulk ferroelectric response. It further discusses how channel engineering supports reliable memory characteristics and scalable integration ...
Eunjin Kim, Jiyong Woo
wiley   +1 more source

A Performance Budgeting Implementation Model for Islamic Republic of Iran's Government [PDF]

open access: yesمطالعات تجربی حسابداری مالی, 2013
Designing the optimum process of shifting traditional input oriented budgeting toward modern output based budgeting systems; defined as performance budgeting, require a special focus on infrastructural, legal and managerial capacities.The vital success ...
Jafar Babajani, Behrooz Khodarahmi
doaj  

On the Role of a Stock Market in the Bank Loan Market: a Study of France, Germany,and the Euro Area (1). [PDF]

open access: yes
In this paper we compare a traditional demand oriented model to a non-traditional capital budgeting model of bank lending based on movements in the equity cost of capital for France, Germany, and the Euro area.
Robert E. Krainer
core  

Time‐Resolved Simultaneous Mapping of Thickness and Nanoparticle Concentration in Nanofluid Thin Films via Imaging Ellipsometry and Deep‐UV Reflectance Imaging

open access: yesAdvanced Materials Interfaces, EarlyView.
This study establishes a dual‐channel optical metrology framework integrating phase‐shifting imaging ellipsometry and deep‐UV reflectance imaging. This label‐free approach enables simultaneous, time‐resolved mapping of film thickness and nanoparticle (NP) concentration in dynamic nanofluid thin films.
Eita Shoji   +3 more
wiley   +1 more source

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