Results 191 to 200 of about 410,227 (240)

Bulk micro-defect detection with low-angle illumination

Review of Scientific Instruments, 2021
The detection of oxygen precipitates, voids, and other defects is critical for semiconductor wafer makers. One of the industry standard techniques for detecting these Bulk Micro-Defects (BMDs) is Semilab’s Light Scattering Tomograph (LST) system. In this measurement, unpatterned wafers are nominally cleaved in half. Illumination is applied to the front
T. Szarvas, G. Molnár, Gy. Nádudvari, Sz. Tóth, O. Almásy, Sz. Spindler, D. Erdei, Sz. Pothorszky, R. Kretschmer, S. Bauer   +9 more
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Bulk vs Surface Defects

2021
This chapter is dedicated to achieving complete and deep understanding why effective implementation of defective engineering cannot be realized without considering the most fundamental principles of materials design and their correlation with processes happened within crystal lattice.
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Defects in hydrothermally grown bulk ZnO

Applied Physics Letters, 2007
Hydrothermally grown bulk ZnO (Tokyo Denpa) was investigated using junction-capacitance spectroscopy on silver oxide Schottky contacts (barrier height of 1.20eV, ideality factor of 1.04). Two main shallow defects, T1 and T2, with thermal activation energies of 13 and 52meV, respectively, were identified.
H. von Wenckstern, H. Schmidt, M. Grundmann, M. W. Allen, P. Miller, R. J. Reeves, S. M. Durbin   +6 more
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Bulk metallic glasses: “Defects” determines performance

Materials Science and Engineering: A, 2016
In the current work, the size effect to plasticity of the Zr50Cu40+xAl10−x (x=0, and 2) bulk metallic glasses has been investigated experimentally. It is found that macroscopic plasticity are affected by different of leading factors. The mean stress drop of serrated flow is positively related to the number of weak regions.
Zhang, C., Qiao, J.C., Pelletier, Jean-Marc, Yao, Y.   +3 more
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Hydrogen-related defects in bulk ZnO

MRS Proceedings, 2009
AbstractZinc oxide (ZnO) has attracted resurgent interest as an active material for energy-efficient lighting applications. An optically transparent crystal, ZnO emits light in the blue-to-UV region of the spectrum. The efficiency of the emission is higher than more “conventional” materials such as GaN, making ZnO a strong candidate for solid-state ...
Matthew D McCluskey, Slade J. Jokela, Marianne C. Tarun   +2 more
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Bulk Buying of Possibly Defective Items

Journal of the Operational Research Society, 1984
Summary: The paper examines buying where faulty items are returned repeatedly until the entire order is obtained defect-free, as is typified by mail- order buying. The advantage of bulk buying is investigated theoretically both when the probability of being defective is assumed constant and when it is allowed to vary.
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Bulk Defect Chemistry of PCFC Cathode Materials: Discussion of Defect Interactions

ECS Meeting Abstracts, 2017
In order to extend the reactive zone for oxygen reduction to water beyond the gas/electrode/electrolyte three phase boundary, cathode materials for proton conducting ceramic fuel cells should exhibit a certain proton conductivity, exceeding 10-5 S/cm [1]. Proton uptake into (Ba,Sr,La)(Mn,Fe,Co)O3- d perovskites considered as cathode
Zohourian, R., Merkle, R., Maier, J.
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NATIVE DEFECT COMPENSATION IN III-ANTIMONIDE BULK SUBSTRATES

Selected Topics in Electronics and Systems, 2004
As-grown, undoped III-antimonide bulk substrates contain high concentration of native defects resulting in high residual carrier density. In this paper, we have demonstrated that native defects can be compensated in bulk substrates of GaSb , InSb , and Ga 1-x In x Sb via impurity doping and low temperature growth from nonstoichiometric melts and ...
R. Pino, null Youngok Ko, P.S. Dutta
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Trapped fractional charges at bulk defects in topological insulators

Nature, 2021
Topological crystalline insulators (TCIs) can exhibit unusual, quantized electric phenomena such as fractional electric polarization and boundary-localized fractional charge1-6. This quantized fractional charge is the generic observable for identification of TCIs that lack clear spectral features5-7, including ones with higher-order topology8-11.
Christopher W. Peterson, Tianhe Li, Wentao Jiang, Taylor L. Hughes, Gaurav Bahl   +4 more
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Bulk Wafer Defects Observable in Vision Chips

32nd European Solid-State Device Research Conference, 2002
During the last years the area of digital cameras based on CMOS technology has grown rapidly. In CMOS, signal processing circuitry and sensor elements can be combined on the same chip, which has resulted in advanced machine vision chip designs. However, the potentially powerful combination of diodes and in-pixel signal processing circuitry, suffers ...
A. Rantzer, C. Svensson
openaire   +1 more source