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Third International Conference on Semantics, Knowledge and Grid (SKG 2007), 2007
This paper explores how to use multi-agent to support online integration and instant collaboration in Internet-based CAD applications. A method to bridge standalone CAD systems is presented. The method uses middleware based multi-agent to wrap the standalone CAD systems. The method is tested in a collaborative tool for heterogeneous CAD applications.
Bin Liao, Bo Meng
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This paper explores how to use multi-agent to support online integration and instant collaboration in Internet-based CAD applications. A method to bridge standalone CAD systems is presented. The method uses middleware based multi-agent to wrap the standalone CAD systems. The method is tested in a collaborative tool for heterogeneous CAD applications.
Bin Liao, Bo Meng
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CAD-SE: Discovering CAD Models on the Web
2018 International Conference on Content-Based Multimedia Indexing (CBMI), 2018In this demo paper, we present “CAD-SE” a search engine for CAD models in the domain of room planning. Many furniture manufacturers offer 3D CAD models for their products in various formats on their websites. Those models are used by architects and interior designers.
Christian Brosch +2 more
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Cad And Foundries For Microsystems
Proceedings of the 34th Design Automation Conference, 1997Besides foundry facilities, Computer-Aided Design (CAD)tools are also required to move microsystems from researchprototypes to an industrial market. Currently available CADtools need extensions before they can be used for theautomated design of micromachined devices.This paper presents a low cost access to microsystemtechnology (MST), applied by the ...
Jean-Michel Karam +8 more
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2011 9th East-West Design & Test Symposium (EWDTS), 2011
ATPG (Automatic Test Pattern Generation) for arbitrary digital circuit is not possible without previously verification feature been realized at first and without testability been estimated and changed to appropriate level as second. ATPG for arbitrary digital circuit is not possible without hazard free sequences generation at third.
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ATPG (Automatic Test Pattern Generation) for arbitrary digital circuit is not possible without previously verification feature been realized at first and without testability been estimated and changed to appropriate level as second. ATPG for arbitrary digital circuit is not possible without hazard free sequences generation at third.
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Proceedings 1999 Design Automation Conference (Cat. No. 99CH36361), 1999
The increasing size and complexity of designs is making the use of hardware description languages (HDLs), such as Verilog and VHDL, more prevalent. They are able to describe both the initial design and intermediate representations of the design as it is readied for fabrication.
Jules P. Bergmann, Mark Horowitz
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The increasing size and complexity of designs is making the use of hardware description languages (HDLs), such as Verilog and VHDL, more prevalent. They are able to describe both the initial design and intermediate representations of the design as it is readied for fabrication.
Jules P. Bergmann, Mark Horowitz
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CAD in the Netherlands: integrated CAD
1986Publisher Summary This chapter discusses the development of integrated computer-aided design (CAD) in the Netherlands. The integrated computer use implies integrated design, meaning design much closer linked, particularly at the early design stages, to related expertise such as costing and environmental and structural engineering.
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IEEE Computer Graphics and Applications, 2005
We discuss the significant technical challenges facing the CAD industry and research community and present an approach to address these issues. The key component of all CAD applications is the end user. Users' success or failure in interacting with CAD products ultimately governs the success of the products themselves.
David J. Kasik +2 more
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We discuss the significant technical challenges facing the CAD industry and research community and present an approach to address these issues. The key component of all CAD applications is the end user. Users' success or failure in interacting with CAD products ultimately governs the success of the products themselves.
David J. Kasik +2 more
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IEEE/ACM International Conference on Computer Aided Design. ICCAD - 2000. IEEE/ACM Digest of Technical Papers (Cat. No.00CH37140), 2002
Olivier Coudert +3 more
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Olivier Coudert +3 more
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