Results 261 to 270 of about 269,147 (313)

Three-terminal spin/charge current router

Journal of Physics: Condensed Matter, 2020
Topological insulator materials have wide applications in electronic and spintronic devices by utilizing the protected edge states. In this paper, based on these topological edge states and energy gaps, we propose some types of spin/charge current router in a three-terminal system consisting of silicene-like nanoribbons (SiNRs).
Jia-En Yang, Xiao-Long Lü, Hang Xie
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Charges and Currents

1987
What wise advice by the king and so fitting for all occasions, especially for this book. We started with the discovery of the strange mechanical properties of rubbers and plastics and we will end with their recently discovered, even stranger properties.
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Charging Current Compensation for Distance Protection

IEEE Transactions on Power Delivery, 2005
When a distance relay is applied to a long transmission line, the capacitance of the transmission line causes oscillation of the distance measurement, although the exact nature of the phenomenon has never been clearly defined. Our research has shown that the degree of oscillation can be reduced significantly by introducing charging current to the ...
T. Kase, Y. Kurosawa, H. Amo
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Bound charges and currents

American Journal of Physics, 2013
Bound charges and currents are among the conceptually challenging topics in advanced courses on electricity and magnetism. It may be tempting for students to believe that they are merely computational tools for calculating electric and magnetic fields in matter, particularly because they are usually introduced through abstract manipulation of integral ...
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Photoinduced Charge Currents in Mesoscopic Rings

Physical Review Letters, 2005
The temporal and spatial controllability of charge distribution in submicron structures opens new avenues for potential applications and for the understanding of nonequilibrium processes. Here we suggest a novel way to trigger and control within picoseconds charge currents and magnetic moments in nanoscopic and mesoscopic ring structures by applying ...
A, Matos-Abiague, J, Berakdar
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Quantifying Via Charging Currents

2nd International Symposium on Plasma Process-Induced Damage, 1997
Via charging currents during via over-etch have been measured for the first time using CHARM@-2 wafers and a special-purpose CHARM@-2-compatible photoresist mask with varying via density. The measurements confirm previous findings which showed increased charging potentials and current densities in the presence of patterned resist [l].
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