Results 311 to 320 of about 5,388,942 (324)
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2006
The physical bases of surface chemical analysis techniques are described in the context of semiconductor analysis. Particular emphasis is placed on the SIMS (secondary ion mass spectrometry) technique, as this is one of the more useful tools for routine semiconductor characterization.
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The physical bases of surface chemical analysis techniques are described in the context of semiconductor analysis. Particular emphasis is placed on the SIMS (secondary ion mass spectrometry) technique, as this is one of the more useful tools for routine semiconductor characterization.
openaire +2 more sources
Chemical analysis of plating solutions
Metal Finishing, 1995Stanley Hirsch, Charles Rosenstein
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Techniques for Analysis of Chemical Biotransformation
Current Protocols in Toxicology, 2005openaire +1 more source
POLARISTROBOMETRIC-CHEMICAL ANALYSIS.
Journal of the American Chemical Society, 1889openaire +2 more sources
Chemical analysis and the problem of chemical safety
Journal of Analytical Chemistry, 2000openaire +2 more sources