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Preparation for circuit simulation
2004In the previous chapter, the complete space of memory faults has been introduced. These faults have a theoretical origin. In order to investigate their validity, an experimental and/or industrial analysis is required; e.g., defect injection in the memory cell and SPICE simulation.
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Proposed for presentation at the 34th IEEE International Conference on Microelectronic Test Structures (ICMTS) held March 21-24, 2022 in Albuquerque, NM., 2022
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