Results 331 to 340 of about 74,167 (345)
Some of the next articles are maybe not open access.
SiSMA—A Tool for Efficient Analysis of Analog CMOS Integrated Circuits Affected by Device Mismatch
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2004Simone Orcioni, Paolo Crippa
exaly
Electrically active stacking faults in CMOS integrated circuits
Journal of Applied Physics, 1979exaly
Process technology for radiation-hardened CMOS integrated circuits
IEEE Journal of Solid-State Circuits, 1976exaly
Integrated CMOS Circuits for Optical Communications
2004Mark Ingels, Michiel Steyaert
openaire +1 more source
Design Consideration in High Temperature Analog CMOS Integrated Circuits
IEEE Transactions on Components, Hybrids and Manufacturing Technology, 1986exaly
Reliability of CMOS/SOS integrated circuits
Microelectronics Reliability, 1985openaire +1 more source

