Results 241 to 250 of about 60,233 (294)
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A Novel Compound Neural Network for Fault Diagnosis
2006 2nd IEEE/ASME International Conference on Mechatronics and Embedded Systems and Applications, 2006Independent Component Analysis (ICA) is a powerful tool for redundancy reduction and nongaussian data analysis. And, Artificial Neural Network (ANN), especially the Self-Organizing Map (SOM) based on unsupervised learning is a kind of excellent method for pattern clustering and recognition. By combining ICA with ANN, we proposed a novel compound neural
Jiao Weidong, Yang Shixi, Yan Gongbiao
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Multiple Enhanced Sparse Decomposition for Gearbox Compound Fault Diagnosis
IEEE Transactions on Instrumentation and Measurement, 2020The vibration monitoring of gearboxes is an effective means of ensuring the long-term safe operation of rotating machinery. A gearbox may have more than one fault in actual applications. Therefore, gearbox compound fault diagnosis should be investigated.
Ning Li +4 more
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Compound fault diagnosis based on probability box theory
2017 9th International Conference on Modelling, Identification and Control (ICMIC), 2017In view of compound fault of rolling bearing in mechanical transmission system, the fault signal was decomposed by probability box modeling method to obtain the different probability box models. The original data with abundant statistical information was taken as the research object.
Tang Hong +3 more
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Tunable Catalytic Alloying Eliminates Stacking Faults in Compound Semiconductor Nanowires
Nano Letters, 2012Planar defects in compound (III-V and II-VI) semiconductor nanowires (NWs), such as twin and stacking faults, are universally formed during the catalytic NW growth, and they detrimentally act as static disorders against coherent electron transport and light emissions.
Heo, H +11 more
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Planar faults in Aurivillius compounds: An X-ray diffraction study
Philosophical Magazine A, 2002Abstract Layered bismuth-containing perovskites are known to be subject to complex structural imperfections such as planar faults. A careful analysis of X-ray powder diffraction lines of the Aurivillius compound SrBi2Nb2O9 shows that stacking faults are located along the c axis and (hk0) reflections are thus unaffected by faulting.
A. Boulle +4 more
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Stacking fault energy and ionicity of cubic III–V compounds
Physica Status Solidi (a), 1978Using weak beam electron microscopy the stacking fault energy (SFE) of III-V compounds is determined by measuring the dissociation width of edge dislocations. The SFE corrected for the lattice parameters is given in meV/atom for GaAs, GaP, GaSb, InAs, InP, and InSb. As expected there is a strong correlation of the SFE with the ionicity of the bond. The
H . Gottschalk, G. Patzeb, H. Alexander
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Regulators faulted for inadequate compounding pharmacy oversight
American Journal of Health-System Pharmacy, 2013D uring hearings in November, Congress faulted lapses in state and federal oversight of pharmacy compounding that might have contributed to the meningitis outbreak associated with allegedly tainted drugs produced by the New England Compounding Center (NECC) of Framingham, Massachusetts ...
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Imaging of polytypes and stacking faults in tetrahedral compounds
Acta Crystallographica Section A Foundations of Crystallography, 1983The resolution attained with a JEOL 200CX electron microscope in top-entry configuration has allowed the direct elucidation of the structure of tetrahedrally bonded compounds. Computer simulation methods were used to calculate through-focus series of images at a range of thicknesses and the conditions for which structural features are interpretable on ...
A. F. Moodie, H. J. Whitfield
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Compound fault prediction of rolling bearing using multimedia data
Multimedia Tools and Applications, 2017Catastrophic failure of mechanical systems due to faults occurring on rolling bearing is still a great challenge. These faults, which are of multiple type, are compounded in nature. Vibration analysis of multimedia signals is one of the most effective techniques for the health monitoring of these bearings.
Sandip Kumar Singh +2 more
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A novel compound neural network for fault sources recognition
2010 International Conference on Computer Application and System Modeling (ICCASM 2010), 2010Independent component analysis (ICA) is a powerful tool for redundancy reduction and nongaussian data analysis. And, artificial neural network (ANN), especially the self-organizing map (SOM) based on unsupervised learning is a kind of excellent method for pattern clustering and recognition. By combining ICA with ANN, a novel compound neural network for
null Jiao Weidong +4 more
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