Results 51 to 60 of about 2,200,532 (289)

Cross-bidge Kelvin resistor (CBKR) structures for measurement of low contact resistances [PDF]

open access: yes, 2007
A convenient test structure for measurement of the specific contact resistance (ρc) of metal-semiconductor junctions is the CBKR structure. During last few decades the parasitic factors which may strongly affect the measurements accuracy for ρc < 10-6 Ω •
Boksteen, B.K.   +6 more
core   +1 more source

Mesoscopic Charge Relaxation

open access: yes, 2006
We consider charge relaxation in the mesoscopic equivalent of an RC circuit. For a single-channel, spin-polarized contact, self-consistent scattering theory predicts a universal charge relaxation resistance equal to half a resistance quantum independent ...
Buttiker, Markus   +2 more
core   +2 more sources

Contact resistance Study of “edge-contacted” metal-graphene interfaces

open access: yes2016 46th European Solid-State Device Research Conference (ESSDERC), 2016
2016 46th European Solid-State Device Research Conference (ESSDERC) : 12-15 Sept. 2016 / [organizers and partner institutions: École Polytechnique Fédérale de Lausanne [und 6 andere] 46th European Solid-State Device Research Conference, ESSDERC 2016, Lausanne, Switzerland, 12 Sep 2016 - 15 Sep 2016; [Piscataway, NJ] : IEEE 7599629, 236-239 (2016).
Passi, V.   +7 more
openaire   +3 more sources

The newfound relationship between extrachromosomal DNAs and excised signal circles

open access: yesFEBS Letters, EarlyView.
Extrachromosomal DNAs (ecDNAs) contribute to the progression of many human cancers. In addition, circular DNA by‐products of V(D)J recombination, excised signal circles (ESCs), have roles in cancer progression but have largely been overlooked. In this Review, we explore the roles of ecDNAs and ESCs in cancer development, and highlight why these ...
Dylan Casey, Zeqian Gao, Joan Boyes
wiley   +1 more source

Extraction of Contact Resistance and DC Modeling in Metal Oxide TFTs

open access: yesIEEE Journal of the Electron Devices Society, 2019
Based on the device physics, a simple and fast method of extracting contact resistance in metal oxide thin-film transistors (MOTFTs) is proposed through the I-V characteristics.
Na Li   +4 more
doaj   +1 more source

Microswitches with Sputtered Au, AuPd,Au-on-AuPt, and AuPtCu Alloy Electric Contacts [PDF]

open access: yes, 2006
This paper is the first to report on a new analytic model for predicting microcontact resistance and the design, fabrication, and testing of microelectromechanical systems (MEMS) metal contact switches with sputtered bimetallic (i.e., gold (Au)-on-Au ...
Cortez, R.   +4 more
core   +1 more source

Transport properties and point contact spectra of Ni_xNb_{1-x} metallic glasses

open access: yes, 2000
Bulk resistivity and point contact spectra of Ni_xNb_{1-x} metallic glasses have been investigated as functions of temperature (0.3-300K) and magnetic field (0-12T). Metallic glasses in this family undergo a superconducting phase transition determined by
A. Bardas   +23 more
core   +1 more source

Conserved structural motifs in PAS, LOV, and CRY proteins regulate circadian rhythms and are therapeutic targets

open access: yesFEBS Letters, EarlyView.
Cryptochrome and PAS/LOV proteins play intricate roles in circadian clocks where they act as both sensors and mediators of protein–protein interactions. Their ubiquitous presence in signaling networks has positioned them as targets for small‐molecule therapeutics. This review provides a structural introduction to these protein families.
Eric D. Brinckman   +2 more
wiley   +1 more source

Elucidating contact-limited temperature dependence of charge transport in 2D tin halide perovskite field-effect transistors

open access: yesJPhys Materials
Two-dimensional (2D) tin halide perovskites are gaining attention for their potential in high-performance field-effect transistors (FETs) due to their ease of processibility and high mobility.
Hyeonmin Choi   +4 more
doaj   +1 more source

Study of the Contact Resistance of Interlaced Stainless Steel Yarns Embedded in Hybrid Woven Fabrics

open access: yesAUTEX Research Journal, 2017
The contact resistance of two interlacing electro-conductive yarns embedded in a hybrid woven fabric will constitute a problem for electro-conductive textiles under certain circumstances.
Vasile Simona   +5 more
doaj   +1 more source

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