Results 181 to 190 of about 217,841 (299)

Tough, Ductile, and Strong Hard‐Soft Cementitious Composite Enabled by Multi‐Material Additive Manufacturing

Advanced Materials, EarlyView.
Drawing inspiration from the layered hard‐soft architecture found in sea sponges, this work establishes a new framework for architected cementitious composites (ACC) through multi‐material additive manufacturing (MMAM) process. The integration of mortar and elastomer phases into layered architectures enables synergistic toughening mechanisms, including
Aimane Najmeddine, Shashank Gupta, William Makinen, Zayvinn Lin, Krystal Delnoce, Reza Moini   +5 more
wiley   +1 more source

An integrated change point detection and online monitoring approach for the ratio of two variables using clustering-based control charts. [PDF]

J Appl Stat
Ahmadi Nadi A, Yeganeh A, Shongwe SC, Shadman A.   +3 more
europepmc   +1 more source

EWMA and DEWMA repetitive control charts under non-normal processes. [PDF]

J Appl Stat, 2021
Nawaz MS, Azam M, Aslam M.
europepmc   +1 more source

Self‐Assembled Monolayers in p–i–n Perovskite Solar Cells: Molecular Design, Interfacial Engineering, and Machine Learning–Accelerated Material Discovery

Advanced Materials, EarlyView.
This review highlights the role of self‐assembled monolayers (SAMs) in perovskite solar cells, covering molecular engineering, multifunctional interface regulation, machine learning (ML) accelerated discovery, advanced device architectures, and pathways toward scalable fabrication and commercialization for high‐efficiency and stable single‐junction and
Asmat Ullah, Ying Luo, Stefaan De Wolf
wiley   +1 more source

The Economic Design of and Control Charts with Preventive Maintenance and Increasing Hazard Rate

, 2010
[[abstract]]Develops the joint economic designs of • and S2 control charts under four operating policies to monitor the process in a situation where the occurrence of the assignable cause follows a general distribution with an increasing hazard rate. The
Huan‐Neng Chiu;Bo‐Shi Huang
core  

n‐Type Polymer Radio Frequency Rectifiers Operating at 18.5 GHz

Advanced Materials, EarlyView.
Combining an n‐doped polymer semiconductor with wafer‐scale asymmetric planar electrodes featuring work function‐engineered contacts yields radio‐frequency diodes and rectifying circuits operating at up to 18.5 GHz. The devices combine scalable manufacturing with an operating frequency previously unattainable by large‐area organic electronics ...
Lazaros Panagiotidis, Filip Aniés, Yiyang Yu, Mohammed Ghadiyali, Hendrik Faber, Zhanibek Bizak, Youssef Kabri, Pavlos Tzourmpakis, Suman Mandal, Linqu Luo, Temur Maksudov, Mohamad Insan Nugraha, Harold F. Mazo‐Mantilla, Patrice Vanelle, Julie Broggi, Khaled N. Salama, Udo Schwingenschlögl, Martin Heeney, Atif Shamim, Thomas D. Anthopoulos   +19 more
wiley   +1 more source

Analysis of door-to-needle time for thrombolysis in acute ischaemic stroke using statistical process control charts. [PDF]

BMJ Neurol Open
Grönroos M, Hällberg V, Helminen M, Koivistoinen T, Palomäki A.   +4 more
europepmc   +1 more source

Measuring the Hall Effect in Hysteretic Materials

Advanced Materials, EarlyView.
The authors highlight common pitfalls in measuring the Hall effect: in hysteretic magnets, improper data processing can create signals that look exotic but are not real. This Perspective explains the origin of these artifacts and presents practical measurement strategies that help researchers identify reliable Hall responses in complex magnetic ...
Jaime M. Moya, Anthony Voyemant, Sudipta Chatterjee, Scott B. Lee, Grigorii Skorupskii, Connor J. Pollak, Leslie M. Schoop   +6 more
wiley   +1 more source

Measuring variations in healthcare data using run charts and statistical process control charts: a survey of general physicians attending the quality improvement workshop. [PDF]

Intern Med J
Aung AK, Mertin H, Wong A, Johnson DF, Lee JI.   +4 more
europepmc   +1 more source

Nonparametric statistical process control: Bootstrap control charts

, 1994
The most commonly used techniques in statistical process control are parametric, and thus require assumptions regarding the statistical properties of the underlying process.
Seppala, Tapani Tomi
core