Results 41 to 50 of about 2,640 (165)

Assumptions of the digital twin in coordinate metrology

Measurement: Sensors
Coordinate metrology, or measurement systems, are an important part of Industry 4.0 and 5.0, which result in a range of data recorded for all production departments. The data can be used not only for inspection, but especially for prediction in the production cycle.
Ksenia Ostrowska, Danuta Irena Owczarek, Adam Gąska, Marcin Krawczyk, Robert Marian Kupiec, Jerzy Sładek   +5 more
openaire   +2 more sources

Application of multi-modal 2D and 3D imaging and analytical techniques to document and examine coins on the example of two Roman silver denarii

Heritage Science, 2018
This case study is applying imaging and analytical techniques from multiple scientific disciplines to digitise coins and evaluate 3D multi-modal visualisation.
Mona Hess, Lindsay W. MacDonald, Jaroslav Valach   +2 more
doaj   +1 more source

Application of Coordinate Measuring Arm for Accurate Measurement of Child Growth

Measurement Science Review, 2018
The article describes an approach to measure child growth using a coordinate measuring arm. For this purpose, a test set up has been built to measure the lower leg length directly on the knee surface and with the help of a plate.
Rępalska Marta, Woźniak Adam, Kulus Marek   +2 more
doaj   +1 more source

Virtual Distances Methodology as Verification Technique for AACMMs with a Capacitive Sensor Based Indexed Metrology Platform

Sensors, 2016
This paper presents a new verification procedure for articulated arm coordinate measuring machines (AACMMs) together with a capacitive sensor-based indexed metrology platform (IMP) based on the generation of virtual reference distances.
Raquel Acero, Jorge Santolaria, Agustin Brau, Marcos Pueo   +3 more
doaj   +1 more source

Error separation in CMM coordinate metrology

Journal of Measurement Science and Instrumentation, 2014
Form error measurement is a critical exercise in providing measures for the quality control in the precision manufacturing industry.Coordinate measuring machine（CMM）is one of the automated systems used in the accurate and precise dimensional measurements
Salah H R Ali, M G El-Sherbiny
doaj  

Development of an on-machine surface measurement system for an ultra-precision five-axis machine [PDF]

MATEC Web of Conferences
Ever-increasing demand for complex freeform surfaces machined by ultra-precision five-axis machines necessitates efficient on-machine surface measurement (OMSM) systems.
Zhong Wenbin, Zeng Wenhan, Yu Guoyu, Jiang Xiangqian   +3 more
doaj   +1 more source

An Optical Coordinate Measuring Machine for Nanoscale Dimensional Metrology

Journal of Advanced Computational Intelligence and Intelligent Informatics, 2004
Coordinate Measuring Machines (CMMs) are commonly used for geometry verification and replication on solid parts and work pieces on many scales. As the parts predicable continues to grow smaller and smaller, so grows the need to accurately measure the dimensional accuracy of these parts.
Eric Kirkland, Thomas R. Kurfess, Steven Y. Liang   +2 more
openaire   +1 more source

Coordinate Transformation Uncertainty Analysis in Large-Scale Metrology

IEEE Transactions on Instrumentation and Measurement, 2015
3-D coordinate transformation, which is based on aligning two sets of common reference points, is frequently applied in large-scale combined measurement to unify coordinate frames and tie individual measurement systems together. However, it introduces uncertainty into the final measurement results.
Yu Ren, Jiarui Lin, Jigui Zhu, Bo Sun 0003, Shenghua Ye   +4 more
openaire   +1 more source

Comparison Analysis of Roundness Measurement of Small Cylindrical Workpieces with Different Styluses

Sensors
To investigate the high-accuracy roundness metrology of a needle roller 1.5 mm in diameter and 5.8 mm in length using the stitching linear scan method, a ruby ball stylus with a tip radius of 150 μm and a diamond stylus with a tip radius of 2 μm were ...
Borong Wu, Chuang Zeng, Qiaolin Li
doaj   +1 more source

Workshop on advanced polarimetric instrumentation: API’09

EPJ Web of Conferences, 2010
The First NanoCharM Workshop on Advanced Polarimetric Instrumentation was focused on the instrumentation developed to work with polarised light, which is the cause of a great deal of research and study in a variety of fields, such as astronomy ...
Garcia-Caurel E.
doaj   +1 more source