Results 181 to 190 of about 111,109 (312)

BugPrioritizeAI for multimodal test case prioritisation using bug reports, code changes, and test metadata. [PDF]

Sci Rep
Kalyani P, Rao CP, Goparaju B, Babu KK, Kandimalla PCR.   +4 more
europepmc   +1 more source

Unveiling the Role of Curvature in Carbon for Improved Energy Release of Ammonium Perchlorate

Advanced Materials, EarlyView.
High‐curvature carbon materials identified via machine learning and simulation can enhance the heat release and combustion performance of ammonium perchlorate. ABSTRACT The catalytic role of carbon curvature in the thermal decomposition of ammonium perchlorate (AP) remains largely unexplored. To address this gap, this study employs machine learning and
Dan Liu, Keliang Song, Haorui Zhang, Zhipeng Liu, Guansong He, Junru Wang, Wenming Yang, Xu Zhao, Zhijian Yang   +8 more
wiley   +1 more source

Chemical Feature Engineering and Defect-Aware Structural Fingerprint Representations for Complex Defects in 2D Materials. [PDF]

J Chem Inf Model
Na Talang C, Kesorn A, Cholsuk C, Vogl T, Hunkao R, Sinsarp A, Suwanna S, Yuma S.   +7 more
europepmc   +1 more source

Bioinspired Adaptive Sensors: A Review on Current Developments in Theory and Application

Advanced Materials, EarlyView.
This review comprehensively summarizes the recent progress in the design and fabrication of sensory‐adaptation‐inspired devices and highlights their valuable applications in electronic skin, wearable electronics, and machine vision. The existing challenges and future directions are addressed in aspects such as device performance optimization ...
Guodong Gong, You Zhou, Qingxiu Li, Wenyu Zhao, Sunyingyue Geng, Hangfei Li, Yan‐Bing Leng, Shirui Zhu, Guanglong Ding, Yongbiao Zhai, Ziyu Lv, Ye Zhou, Su‐Ting Han   +12 more
wiley   +1 more source

MFE-YOLO: A Multi-Scale Feature Enhanced Network for PCB Defect Detection with Cross-Group Attention and FIoU Loss. [PDF]

Entropy (Basel)
Di R, Fan H, Feng H, Lv Z, Shu L, Xie R, Qian R.   +6 more
europepmc   +1 more source

Spiro‐Phenothiazine Hole‐Transporting Materials: Unlocking Stability and Scalability in Perovskite Solar Cells

Advanced Materials, EarlyView.
Fluorene‐functionalized spiro‐phenothiazine (PTZ‐Fl) exhibits strong Li+ affinity and thermal stability, enabling a PCE of 25.75% in small‐area cells and 22.07% in 25 cm2 modules. Under ISOS‐L3 conditions, PTZ‐Flbased devices retain over 80% efficiency after 1000 hours, demonstrating superior stability and scalability compared to spiro‐OMeTAD for next ...
Javier Urieta‐Mora, Seung Ju Choi, Jaeki Jeong, Silvia Orecchio, Inés García‐Benito, Manuel Pérez‐Escribano, Joaquín Calbo, Likai Zheng, Minseop Byun, Seyeong Song, Gi‐Hwan Kim, Shaik M. Zakeeruddin, Seog‐Young Yoon, Yimhyun Jo, Agustín Molina‐Ontoria, Enrique Ortí, Nazario Martín, Michael Grätzel   +17 more
wiley   +1 more source

Lightweight Visual Localization of Steel Surface Defects for Autonomous Inspection Robots Based on Improved YOLOv10n. [PDF]

Sensors (Basel)
Tong J, Zhang X, Lu X, Cao H, Yao L, Gao B.   +5 more
europepmc   +1 more source

Cross-Project Defect Prediction via Transferable Deep Learning-Generated and Handcrafted Features

, 2019
Shaojian Qiu, Lu Lu, Ziyi Cai, Siyu Jiang   +3 more
openalex   +1 more source

Artificial Intelligence‐Assisted Workflow for Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling

Advanced Materials, EarlyView.
AI‐Assisted Workflow for (Scanning) Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling. Abstract (Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the functional properties of ...
Marc Botifoll, Ivan Pinto‐Huguet, Enzo Rotunno, Thomas Galvani, Catalina Coll, Payam Habibzadeh Kavkani, Maria Chiara Spadaro, Yann‐Michel Niquet, Martin Børstad Eriksen, Sara Martí‐Sánchez, Georgios Katsaros, Giordano Scappucci, Peter Krogstrup, Giovanni Isella, Andreu Cabot, Gonzalo Merino, Pablo Ordejón, Stephan Roche, Vincenzo Grillo, Jordi Arbiol   +19 more
wiley   +1 more source

C-ViT: An Improved ViT Model for Multi-Label Classification of Bamboo Chopstick Defects. [PDF]

Sensors (Basel)
Wang W, Peng W, Zeng L, Shen Y, Zhu C, Kuang Y.   +5 more
europepmc   +1 more source