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FIB cross‐sectioning of a single rapidly solidified hypereutectic Al‐Si powder particle for HRTEM

Microscopy Research and Technique, 2005
AbstractA creative technique of in‐situ focused ion beam (FIB) extraction was introduced to prepare a gas atomized rapidly solidified hypereutectic Al‐Si single particle's cross‐section for High Resolution Transmission Electron Microscopy (HRTEM) analysis.
K E, Rea   +3 more
openaire   +3 more sources

A preparation method of sections of fine particles and cross-sectional transmission electron microscopy of Ni powder

Journal of Electron Microscopy, 1997
T. Yoshioka   +5 more
openaire   +1 more source

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