Results 181 to 190 of about 19,534 (248)

Microdefects in Czochralski Silicon

Nihon Kessho Gakkaishi, 1979
openaire   +2 more sources

A Soft Measurement Method for the Tail Diameter in the Growing Process of Czochralski Silicon Single Crystals [PDF]

Lei Jiang, Da Teng, Yue Zhao
openalex   +1 more source

Terbium-doped gadolinium garnet thin films grown by liquid phase epitaxy for scintillation detectors. [PDF]

RSC Adv
Baillard A, Douissard PA, Loiko P, Martin T, Mathieu E, Camy P.   +5 more
europepmc   +1 more source

Oxidation-induced stacking faults in nitrogen-doped czochralski silicon investigated by transmission electron microscope

, 2004
Xu Jin, Deren Yang, Jia Chu, Xiangyang Ma, Duanlin Que, 浙江大学硅材料国家重点实验室,杭州 310027   +5 more
openalex   +1 more source

Single Crystals of Vanadium Oxides as a Lens for Understanding Structural and Electronic Phase Transformations, Ion Transport, Chemo-Mechanical Coupling, and Electrothermal Neuronal Emulation. [PDF]

Chem Rev
Ponis J, Hariyani S, Agbeworvi G, Chakraborty S, Balcorta V, Pérez-Vázquez J, Rogers BL, Chiang YH, Jessel A, Brown TD, Williams RS, Pharr M, Qian X, Banerjee S.   +13 more
europepmc   +1 more source

Effect of energy back transfer from Er³⁺ to Yb³⁺ ions on the upconversion luminescence of Er:NaYb(MoO₄)₂ and Yb,Er:NaBi(MoO₄)₂. [PDF]

Front Optoelectron
Wang M, Zhang M, Ding S, Hu H, Zhang C, Zou Y.   +5 more
europepmc   +1 more source

Advances in perovskite-based scintillation materials for gamma-ray spectroscopy: issues and opportunities. [PDF]

RSC Adv
Miah MH, Khandaker MU, Saengkaew P, Numan A, Islam MA.   +4 more
europepmc   +1 more source

Advanced Camera Detection and Measurement System in the Czochralski Process

, 2018
Endre Arnesen Gjølstad
openalex   +1 more source

Silicon materials task of the low cost solar array project (part 2) [PDF]

Blais, P. D., Davis, J. R., Hopkins, R. H., Mccormick, J. R., Mchugh, J. P., Rai-Choudhury, P., Seidensticker, R. G.   +6 more
core   +1 more source