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Two-dimensional Czochralski growth

Nature Materials
Seoung-Ki Lee, Jong-Hyun Ahn
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Defects in Annealed Czochralski Silicon

Physica Status Solidi (a), 1980
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Microdefects in Czochralski Silicon

The doctoral thesis deals with analyses of defects in single crystals of Czochralski silicon doped with boron. Mechanisms of formation of circular patterns of oxidation induced stacking faults are studied. The main goal of the work is to explain the mechanisms of formation of the observed defect patterns and to develop methods for control of this ...
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