Results 191 to 200 of about 20,715 (264)

Solving Data Overlapping Problem Using A Class‐Separable Extreme Learning Machine Auto‐Encoder

open access: yesAdvanced Intelligent Systems, Volume 7, Issue 3, March 2025.
The overlapping and imbalanced data in classification present key challenges. Class‐separable extreme learning machine auto‐encoding (CS‐ELM‐AE) is proposed, which is an enhancement of ELM‐AE that better handles overlapping data by clustering points from the same class together. Applying oversampling addresses imbalanced data.
Ekkarat Boonchieng, Wanchaloem Nadda
wiley   +1 more source

IAR‐Net: Tabular Deep Learning Model for Interventionalist's Action Recognition

open access: yesAdvanced Intelligent Systems, EarlyView.
This study presents IAR‐Net, a deep‐learning framework for catheterization action recognition. To ensure optimality, this study quantifies interoperator similarities and differences using statistical tests, evaluates the distribution fidelity of synthetic data produced by six generative models, and benchmarks multiple deep‐learning models.
Toluwanimi Akinyemi   +7 more
wiley   +1 more source

Cooperative Decode-and-Forward Relaying for Secure Multicasting

open access: yesETRI Journal, 2016
Jong-Ho Lee   +3 more
openaire   +1 more source

Roadmap on Artificial Intelligence‐Augmented Additive Manufacturing

open access: yesAdvanced Intelligent Systems, EarlyView.
This Roadmap outlines the transformative role of artificial intelligence‐augmented additive manufacturing, highlighting advances in design, monitoring, and product development. By integrating tools such as generative design, computer vision, digital twins, and closed‐loop control, it presents pathways toward smart, scalable, and autonomous additive ...
Ali Zolfagharian   +37 more
wiley   +1 more source

One-click reconstruction in single-molecule localization microscopy via experimental parameter-aware deep learning. [PDF]

open access: yesNpj Imaging
Saguy A   +8 more
europepmc   +1 more source

Machine Learning‐Based Standard Compact Model Binning Parameter Extraction Methodology for Integrated Circuit Design of Next‐Generation Semiconductor Devices

open access: yesAdvanced Intelligent Systems, EarlyView.
This study presents a neural network‐based methodology for Berkeley Short‐Channel IGFET Model–Common Multi‐Gate parameter extraction of gate‐all‐around field effect transistors, integrating binning adaptive sampling and transformer neural networks to efficiently capture current–voltage and capacitance–voltage characteristics.
Jaeweon Kang   +4 more
wiley   +1 more source

Hierarchical Language Models for Semantic Navigation and Manipulation in an Aerial‐Ground Robotic System

open access: yesAdvanced Intelligent Systems, EarlyView.
A hierarchical multimodal framework coupling a large language model for task decomposition and semantic mapping with a fine‐tuned vision‐language model for semantic perception, enhanced by GridMask, is presented. An aerial‐ground robot team exploits the semantic map for global and local planning.
Haokun Liu   +6 more
wiley   +1 more source

Learning to decode logical circuits. [PDF]

open access: yesNat Comput Sci
Zhou Y   +5 more
europepmc   +1 more source

Home - About - Disclaimer - Privacy