Results 171 to 180 of about 72,567 (294)

Surface Chemical Analysis of Plastic Materials by X‐Ray Photoelectron Spectroscopy: Understanding Weathering, Fragmentation and Contaminant Uptake in Marine Environments

open access: yesMacromolecular Materials and Engineering, EarlyView.
This Perspective demonstrates how X‐ray photoelectron spectroscopy (XPS) uncovers surface chemical changes in plastics, providing insight into weathering‐driven fragmentation and contaminant adsorption. The Perspective underscores XPS's pivotal role in elucidating fragmentation mechanisms, predicting pollutant–plastic interactions, and guiding ...
Tiziano Di Giulio   +2 more
wiley   +1 more source

A Novel Approach to Enamel Remineralization of White Spot Lesions Using Nanoparticles

open access: yesNano Select, EarlyView.
Nanotechnology serves as a transformative tool for improved enamel remineralization. Magnesium oxide (MgO) nanoparticles are biodegradable, biocompatible, and exhibit a robust antimicrobial effect against common oral pathogens, including Streptococcus mutans, Staphylococcus aureus, Enterococcus faecalis, and Candida albicans.
Ghada H. Naguib   +5 more
wiley   +1 more source

Comprehensive Surrogate Models for Predicting the Melt Conveying Characteristics of Channel Segments in High‐Performance Single‐Screw Extruders

open access: yesPolymer Engineering &Science, EarlyView.
Generalized analytical equations were developed that accurately predict the local pumping characteristics, viscous dissipation, and average shear rates in channels of both conventional and high‐performance single‐screw extruders. Applied within segmented extruder calculations, these models aid in screw design and process troubleshooting without the ...
Daniel Herzog   +3 more
wiley   +1 more source

Five-body recombination of identical bosons. [PDF]

open access: yesProc Natl Acad Sci U S A
Higgins MD, Greene CH.
europepmc   +1 more source

Electron Channeling Contrast Imaging for the Characterization of Dislocations in III−V Thin Films on Silicon (001)

open access: yesphysica status solidi (a), EarlyView.
Defect characterization plays a crucial role in semiconductor research, yet the development of fast, cheap, and nondestructive tools remains challenging. This work applies electron channeling contrast imaging (ECCI) to III–V thin films on silicon, examining beam parameters and diffraction conditions.
Laura Monge‐Bartolome   +8 more
wiley   +1 more source

Comparison of time-of-flight and MIEZE neutron spectroscopy of H<sub>2</sub>O. [PDF]

open access: yesJ Appl Crystallogr
Beddrich L   +9 more
europepmc   +1 more source

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