Results 171 to 180 of about 72,567 (294)
Nuclear Effects in Deep Inelastic Scattering and Transition Region [PDF]
S. Kumano
openalex +1 more source
This Perspective demonstrates how X‐ray photoelectron spectroscopy (XPS) uncovers surface chemical changes in plastics, providing insight into weathering‐driven fragmentation and contaminant adsorption. The Perspective underscores XPS's pivotal role in elucidating fragmentation mechanisms, predicting pollutant–plastic interactions, and guiding ...
Tiziano Di Giulio +2 more
wiley +1 more source
Interactions and Cold Collisions of AlF in the Ground and Excited Electronic States with He. [PDF]
Ganesan-Santhi S +3 more
europepmc +1 more source
A Novel Approach to Enamel Remineralization of White Spot Lesions Using Nanoparticles
Nanotechnology serves as a transformative tool for improved enamel remineralization. Magnesium oxide (MgO) nanoparticles are biodegradable, biocompatible, and exhibit a robust antimicrobial effect against common oral pathogens, including Streptococcus mutans, Staphylococcus aureus, Enterococcus faecalis, and Candida albicans.
Ghada H. Naguib +5 more
wiley +1 more source
Selective Nonthermal Melting in Phlogopite under Ultrafast Energy Deposition. [PDF]
Medvedev N.
europepmc +1 more source
Wilson line correlator in the MV model: relating the glasma to deep inelastic scattering [PDF]
T. Lappi
openalex +1 more source
Generalized analytical equations were developed that accurately predict the local pumping characteristics, viscous dissipation, and average shear rates in channels of both conventional and high‐performance single‐screw extruders. Applied within segmented extruder calculations, these models aid in screw design and process troubleshooting without the ...
Daniel Herzog +3 more
wiley +1 more source
Five-body recombination of identical bosons. [PDF]
Higgins MD, Greene CH.
europepmc +1 more source
Defect characterization plays a crucial role in semiconductor research, yet the development of fast, cheap, and nondestructive tools remains challenging. This work applies electron channeling contrast imaging (ECCI) to III–V thin films on silicon, examining beam parameters and diffraction conditions.
Laura Monge‐Bartolome +8 more
wiley +1 more source
Comparison of time-of-flight and MIEZE neutron spectroscopy of H<sub>2</sub>O. [PDF]
Beddrich L +9 more
europepmc +1 more source

