Results 31 to 40 of about 20,846,472 (359)
Capacitive Spectroscopy of Deep Levels in Silicon with Samarium Impurity
The effect of thermal treatment on the behavior of samarium atoms introduced into silicon during the growth process was studied using the method of transient capacitive deep-level spectroscopy (DLTS).
Sharifa B. Utamuradova +3 more
doaj +1 more source
Development of Monitoring Robot System for Tomato Fruits in Hydroponic Greenhouses
Crop monitoring is highly important in terms of the efficient and stable performance of tasks such as planting, spraying, and harvesting, and for this reason, several studies are being conducted to develop and improve crop monitoring robots. In addition,
Dasom Seo +2 more
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Deep Stacked Hierarchical Multi-Patch Network for Image Deblurring [PDF]
Despite deep end-to-end learning methods have shown their superiority in removing non-uniform motion blur, there still exist major challenges with the current multi-scale and scale-recurrent models: 1) Deconvolution/upsampling operations in the coarse-to-
Hongguang Zhang +3 more
semanticscholar +1 more source
Schottky CdTe X-ray detectors exhibit excellent spectroscopic performance but suffer from instabilities. Hence it is of extreme relevance to investigate their electrical properties.
Isabella Farella, Adriano Cola
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Investigating the possibility of using CdTeSe-based materials for ionizing radiation detectors
The article describes the study of the properties of materials based on CdTe1-xSex suitable for X-ray and gamma radiation detectors. The purpose of the study was to determine by computer modeling the optimal content of impurities and structural defects ...
Оleksandr Kondrik
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Solid-state ionizing radiation detectors based on high-resistance semiconductors can be used to monitor the safety of nuclear reactors. High-resistance CdTe and CdZnTe have very good electrophysical and detector properties.
Alexander Kondrik, Gennadiy Kovtun
doaj +1 more source
Deep learning enables structured illumination microscopy with low light levels and enhanced speed
Structured illumination microscopy (SIM) surpasses the optical diffraction limit and offers a two-fold enhancement in resolution over diffraction limited microscopy.
Luhong Jin +8 more
semanticscholar +1 more source
ABOUT THE SILICON SENSITIVITY OF THE DEEP LEVEL WITH ALTERNATING PRESSURE
: This paper discusses the strain sensitivity of silicon with deep levels under variable pressure. It is shown that in the pressure swing in silicon with deep levels, there is a redistribution of the primary spatial inhomogeneities in the distribution of
Ikrom gulamjonovich Tursunov +2 more
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Deep Face Recognition: A Survey [PDF]
Deep learning applies multiple processing layers to learn representations of data with multiple levels of feature extraction. This emerging technique has reshaped the research landscape of face recognition (FR) since 2014, launched by the breakthroughs ...
Mei Wang, Weihong Deng
semanticscholar +1 more source
Deep level-set method for Stefan problems
We propose a level-set approach to characterize the region occupied by the solid in Stefan problems with and without surface tension, based on their recent probabilistic reformulation. The level-set function is parameterized by a feed-forward neural network, whose parameters are trained using the probabilistic formulation of the Stefan growth condition.
Mykhaylo Shkolnikov +2 more
openaire +2 more sources

