Results 191 to 200 of about 3,392,388 (248)
In situ synchrotron high‐energy X‐ray diffraction reveals the real‐time high‐temperature phase evolution of a ternary V‐9Si‐6.5B alloy. The study uncovers a kinetically delayed V5SiB2 → V8SiB4 transformation governed by massive structural and chemical barriers.
Zahra Sabeti +4 more
wiley +1 more source
YOLOv8s-BISW a Surface Defect Detection Algorithm for Stainless Steel Pipes. [PDF]
Yang Z +5 more
europepmc +1 more source
Digitalizing electroplating requires both domain knowledge and interoperability. This work introduces PlatOn, a domain ontology for trivalent chromium plating and coating characterization, and a hybrid pipeline that aligns it to a mid‐level reference ontology by combining eight similarity metrics with language model reasoning. Expert‐validated mappings
Janik Harter +10 more
wiley +1 more source
SML-YOLO: a lightweight insulator defect detection algorithm for transmission lines under harsh weather conditions. [PDF]
Ren G, Wang H.
europepmc +1 more source
The OntOMat ontology establishes a structured framework for polymer matrix fiber reinforced composite materials, integrating manufacturing processes, characterization methods, and multiscale design through the VDI/VDE 3682 formalized process description standard.
Nicolas Christ +19 more
wiley +1 more source
Schematic representation of modes of microcrack nucleation, growth and temporary arrestment at different boundaries, with the criteria for crack propagation in three scenarios: (1) large notch, (2) defect/small sharp notch, and (3) long crack. This work revisits and integrates results on the fatigue behavior of advanced bainitic steels (in particular ...
Lucia Morales‐Rivas
wiley +1 more source
YOLOv11-SR: An Enhanced YOLOv11-Based Framework for Defect Detection in Complex Substation Inspection Images. [PDF]
Liu X, Hu J, Jiang Z, Zeng L, Xi Y.
europepmc +1 more source
Residual adhesive after electrode loading in adhesive‐assisted resistance spot welding is quantified through a traceable experimental‐to‐digital workflow. Chromatic confocal topography provides calibrated surface‐height data, while OpenCV detects the electrode imprint and integrates adhesive height into comparable volume metrics.
Sung‐Min Wi, Jiangdong Zhao
wiley +1 more source
Physics-Guided Patch Distribution Modeling for Unsupervised Pin Defect Detection of Electrical Connectors. [PDF]
Wang G, Mao S, Tang F, Hu W, Xiang J.
europepmc +1 more source

