Results 181 to 190 of about 5,400,490 (233)
Some of the next articles are maybe not open access.
Dynamic COQUALMO: Defect Profiling over Development Cycles
2009Various techniques have been used for managing software quality, including those that predict defect counts over time. This paper introduces a simulation model based on COQUALMO, which can be calibrated to organizational process performance for estimating counts of residual defects.
Dan Houston +2 more
openaire +1 more source
Spot profile analysis (LEED) of defects at silicon surfaces
Surface Science Letters, 1983Abstract The knowledge of defects at silicon surfaces is important to understand both the effect of all kinds of processing steps and the performance of the devices. A unique possibility for qualitative and quantitative evaluation of defects is provided by spot profile analysis of the low energy electron diffraction pattern (SPA-LEED).
openaire +1 more source
Positron beam defect profiling of silicon epitaxial layers
Journal of Applied Physics, 1991Epitaxial layers of silicon grown on a Si(100) substrate by molecular-beam epitaxy (MBE) and solid-phase epitaxy (SPE) have been investigated by slow positron beam analysis methods. Results of Doppler broadening measurements revealed that the S parameter of the SPE material is considerably higher than the value measured for the MBE layer, indicative of
H. Schut +3 more
openaire +1 more source
Profiling of defects using deep level transient spectroscopy
Journal of Applied Physics, 1986Deep level transient spectroscopy of p–n junctions, Schottky barriers, or metal-oxide-semiconductor (MOS) capacitors is widely used to obtain the concentrations of defects and their profiles in semiconductors. The use of this technique for profiling presents several difficulties, some of which have not been taken into account in the works previously ...
D. Stievenard, D. Vuillaume
openaire +1 more source
GLOBAL PROTEOME PROFILE OF DEFECTIVE DECIDUALIZATION
Fertility and Sterility, 2023Nerea Castillo-Marco +8 more
openaire +1 more source
A Sensor Liftoff Modification Method of Magnetic Flux Leakage Signal for Defect Profile Estimation
IEEE transactions on magnetics, 2017Jian Feng +3 more
semanticscholar +1 more source
2-D defect profile reconstruction from ultrasonic guided wave signals based on QGA-kernelized ELM
Neurocomputing, 2014Bing Liu +4 more
semanticscholar +1 more source
ICC Profile Based Defect Simulation
Color and Imaging Conference, 2006Ingeborg Tastl +4 more
openaire +1 more source
Optimizing the reflow profile via defect mechanism analysis
Soldering & Surface Mount Technology, 1999A reflow profile is proposed which is engineered to optimize soldering performance based on defect mechanism analysis. In general, a slow ramp‐up rate is desired in order to minimize hot slump, bridging, tombstoning, skewing, wicking, opens, solder beading, solder balling, and components cracking. A minimized soaking zone reduces voiding, poor wetting,
openaire +1 more source
A study of cyclic dependencies on defect profile of software components
Journal of Systems and Software, 2013Tosin Daniel Oyetoyan +2 more
semanticscholar +1 more source