Results 171 to 180 of about 1,909,618 (298)
Surface roughness in microfluidic device fabrication: limitations of conventional methods and a novel solution for multi-material bonding. [PDF]
Lehmann C +3 more
europepmc +1 more source
Controlling counterion exchange rate during aqueous phase separation enables the formation of skin‐free, homogeneously porous polyelectrolyte complex hydrogels by suppressing kinetically trapped skin layers and macrovoids. The resulting hydrogel networks exhibit exceptional toughness (∼15 MJ·m−3) and enable 3D (bio)printing and post‐functionalization ...
Adrivit Mukherjee +7 more
wiley +1 more source
Double-Sided Tape in Microfluidics: A Cost-Effective Method in Device Fabrication. [PDF]
Smith S, Sypabekova M, Kim S.
europepmc +1 more source
A systematic review is conducted to assess the influence of electrode architecture across micro‐ to mesoscopic length scales on electron‐transfer pathways in electrocatalysis. We discuss the structure‐activity relationships in electrocatalytic applications, including resource recovery and environmental remediation, and provide cost‐effective, efficient
Manshu Zhao +6 more
wiley +1 more source
Editorial for the Special Issue on Microfluidic Device Fabrication and Cell Manipulation. [PDF]
Matsuura K.
europepmc +1 more source
This Perspective highlights atom probe tomography as a powerful tool for understanding the atomic‐scale defect chemistry in HfO2‐based ferroelectrics. 3D mapping of dopants, point defects, and interface chemistry can provide new insight into defect‐driven mechanisms underpinning the ferroelectricity in the system and guide the design of more reliable ...
Kasper Hunnestad +3 more
wiley +1 more source
Progress on Material Design and Device Fabrication via Coupling Photothermal Effect with Thermoelectric Effect. [PDF]
Liu S, Huo B, Guo CY.
europepmc +1 more source
Low‐frequency noise spectroscopy defines the resolvable conductance states of synaptic FeFETs by coupling read‐current fluctuation with usable dynamic range. The resulting noise‐limited bit precision establishes a universal, device‐agnostic reliability metric beyond the memory window, enabling quantitative benchmarking and rational design of high ...
Jaehong Park +12 more
wiley +1 more source
Two Coexisting Pathways to Volatility in Valence‐Change Memory Devices
Volatile VCM‐type memristive devices exhibit current relaxation after resistive switching, but their microscopic origin remains debated. Using pulsed measurements and a new Tunnel‐DLTS approach on Pt/SrTiO3/Nb:SrTiO3 devices, we show that post‐SET volatility is predominantly ionic, while electronic contributions—arising from quasi‐Fermi‐level ...
Johannes Hellwig +3 more
wiley +1 more source
Advancements in self-assembling peptides: Bridging gaps in 3D cell culture and electronic device fabrication. [PDF]
Jafari A.
europepmc +1 more source

