Results 211 to 220 of about 1,754 (255)

Real-time dispersion compensation in scanning interferometry

open access: yesOptics Letters, 2002
We propose and demonstrate a method of real-time dispersion compensation suitable for scanning interferometry and optical coherence tomography. Static grating tilt in a scanning frequency-domain optical delay line is shown to produce dispersion that is linearly proportional to scan position, and we use this property to achieve depth-dependent ...
Smith, E. D. J.   +2 more
openaire   +7 more sources

Single-shot dispersive interferometry for inline surface inspection

open access: yes, 2023
The dispersive interferometry provides an instantaneous surface measurement in a single camera frame, making it resistant to environmental disturbances and ideal for in-process surface metrology.
Dawei Tang   +2 more
exaly   +2 more sources

Absolute distance measurement by dispersive interferometry using a femtosecond pulse laser [PDF]

open access: yesOptics Express, 2006
We describe an interferometric method that enables to measure the optical path delay between two consecutive femtosecond laser pulses by way of dispersive interferometry.
Ki-Nam Joo, Seung-Woo Kim
exaly   +2 more sources

Dispersion compensation in stellar interferometry

Applied Optics, 1996
In long-baseline stellar interferometry, spectrometers are used to disperse starlight for measuring visibility at multiple wavelengths and for fringe tracking with channeled spectra. However, neither prisms nor gratings are well suited to the observation of fringes with wide spectral bandwidths because the mapping from wave number to detector ...
P R, Lawson, J, Davis
openaire   +2 more sources

Refractometric low coherence interferometry: dispersion interferometry

SPIE Proceedings, 2005
Primarily, low-coherence interferometry yields the optical length, i. e. the product of sample length or sample depth data times the complementary sample refractive index. Each quantity, refractive index as well as sample depth can be obtained from the optical length if the complement is known.
M. Bagherzadeh   +4 more
openaire   +1 more source

Chromatically dispersed interferometry with wavelet analysis

Optics Letters, 2006
A new white-light interferometry point sensor utilizing a chromatically dispersed depth detection field is addressed. Monitoring the interference in the optical frequency domain allows for microscopic height detection without the necessity of a mechanical axial scan.
Evangelos, Papastathopoulos   +2 more
openaire   +2 more sources

Measurement of the influence of dispersion on white-light interferometry

Applied Optics, 2004
White-light interferometry is a well-established method for measuring the height profiles of samples with rough as well as with smooth surfaces. Because white-light interferometry uses broadband light sources, the problem of dispersion arises. Because the optical paths in the two interferometer arms cannot be balanced for all wavelengths, the white ...
Pavel, Pavlicek, Jan, Soubusta
openaire   +2 more sources

Phase retrieval algorithm for line-scan dispersive interferometry [PDF]

open access: yes, 2018
The line-scan dispersive interferometry (LSDI) benefits from single-shot measurement in nature and has potential to perform in-line surface metrology. In this technique, the interference beam produced by the two arms of the interferometer is spatially ...
Dawei Tang, Feng Gao, Xiangqian Jiang
exaly   +2 more sources

Dispersion in stellar interferometry

Applied Optics, 1990
The effects of uncompensated dispersion on the fringe visibility in a two beam interferometer are examined for a long baseline stellar interferometer with a path compensator in air rather than in vacuo. We derive a criterion based on the central fringe visibility for evaluating the effects of dispersion and develop a method for selecting suitable ...
openaire   +2 more sources

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