Results 191 to 200 of about 76,642 (241)
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Isothermal frequency scan DLTS
physica status solidi (a), 1986Le mode de balayage isotherme, appele mode de balayage en frequence, presente plusieurs avantages sur le mode de balayage de la temperature.
G. Ferenczi, J. Boda, T. Pavelka
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Integrated DLT and non-DLT system design for central bank digital currency
Proceedings of the 5th International Conference on Sustainable Information Engineering and Technology, 2020Central Bank Digital Currency (CBDC) is gaining popularity due to its potential benefit. However, experiments to explore the Distributed Ledger Technology (DLT) based CBDC is mostly done in the wholesale area, not in the retail area which has more impact on the public.
Danarto Tri Sasongko, Setiadi Yazid
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Note on the Analysis of DLTS and C2-DLTS
Japanese Journal of Applied Physics, 1982The difference in the peak temperatures of DLTS and C2-DLTS is discussed with reference to the measurement of deep levels in semiconductors. The emission rate of a trap level can be accurately determined when the peak temperature observed in DLTS agrees with that in C2-DLTS. When the peak temperatures disagree, the trap depth and trap density cannot
Hajime Tomokage +2 more
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D6.2 DLT Architecture and Governance Model
2023The present document constitutes the Deliverable D6.2 “DLT Architecture and Governance Model – First version” in the framework of the project titled “Data hub for the Creation of Energy Communities at Local Level and to Advance Research on them” (Project Acronym: DATA CELLAR, Grant Agreement No.
Favenza, Alfredo +2 more
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A simple charge-based DLTS technique
Physica Status Solidi (a), 1981A charge-based DLTS technique is proposed for characterizing the interface states and, with some restrictions, the bulk traps in MIS, p–n, and Schottky-barrier diodes. The technique uses very simple devices — a mechanical chopper and a standard electrometer, but inspite of this a high sensitivity of the order of 108 eV−1 cm−2 can be reached when ...
K. I. Kirov, K. B. Radev
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Solid State Communications, 1981
Abstract It is shown theoretically that correlation methods of deep level transient spectroscopy give results sensitive to thermal capture effects. In thermal emission studies, the apparent trap depth depends on the free-carrier concentration.
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Abstract It is shown theoretically that correlation methods of deep level transient spectroscopy give results sensitive to thermal capture effects. In thermal emission studies, the apparent trap depth depends on the free-carrier concentration.
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A Modulated DLTS Method for Large Signal Analysis (C2-DLTS)
Japanese Journal of Applied Physics, 1981For the analysis of deep-level parameters in semiconductors, a new DLTS (Deep-Level Transient Spectroscopy) method has been proposed, in which a squaring device for the capacitance-signal processing is used with the conventional DLTS system. This method (C2-DLTS) is simple and is especially effective in the precise analysis of large signals due to ...
Hideyo Okushi, Yozo Tokumaru
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Acta Physica Academiae Scientiarum Hungaricae, 1980
A method and an apparatus used for measuring of the deep level content of semiconducting crystals are described. The investigation is based on the observation of capacitance (voltage) relaxation of diodes. The evaluation of the relaxation curve is the same as proposed first byLang [1], the so-called DLTS (deep level transient spectroscopy) method.
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A method and an apparatus used for measuring of the deep level content of semiconducting crystals are described. The investigation is based on the observation of capacitance (voltage) relaxation of diodes. The evaluation of the relaxation curve is the same as proposed first byLang [1], the so-called DLTS (deep level transient spectroscopy) method.
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2015
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