Results 151 to 160 of about 325,643 (162)
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CMP-free and CMP-less approaches for multilevel Cu/low-k BEOL integration

International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224), 2001
M. Tsai   +8 more
semanticscholar   +1 more source

Improved two-step Brytal process for electropolishing of aluminum alloys

, 2018
M. Sepulveda   +3 more
semanticscholar   +1 more source

Improvement in Surface Roughness of Selective Laser Melted Hastelloy X Using Electropolishing and Vibration Tumbling

Journal of materials engineering and performance (Print)
M. Amiri   +3 more
semanticscholar   +1 more source

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